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"Sarfert, T.M."
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SOCRATES: a highly efficient automatic test pattern generation system
by
Schulz, M.H.
,
Trischler, E.
,
Sarfert
,
T.M
.
Published in
IEEE transactions on computer-aided design of integrated circuits and systems
(01.01.1988)
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A hierarchical test pattern generation system based on high-level primitives
by
Sarfert
,
T.M
.
,
Markgraf, R.G.
,
Schulz, M.H.
,
Trischler, E.
Published in
IEEE transactions on computer-aided design of integrated circuits and systems
(01.01.1992)
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Hierarchical test pattern generation based on high-level primitives
by
Sarfert
,
T.M
.
,
Markgraf, R.
,
Trischler, E.
,
Schulz, M.H.
Published in
Proceedings. 'Meeting the Tests of Time'., International Test Conference
(1989)
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applied sciences
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circuit faults
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circuit testing
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test pattern generators
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very large scale integration
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applied sciences
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automatic test pattern generation
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IEEE Electronic Library (IEL)
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