An Analytical Model for the Threshold Voltage of Short-Channel Double-Material-Gate (DMG) MOSFETs with a Strained-Silicon (s-Si) Channel on Silicon-Germanium (SiGe) Substrates
Bhushan, Shiv, Sarangi, Santunu, Gopi, Krishna Saramekala, Santra, Abirmoya, Dubey, Sarvesh, Tiwari, Pramod Kumar
Published in Journal of semiconductor technology and science (01.08.2013)
Published in Journal of semiconductor technology and science (01.08.2013)
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Journal Article
An Analytical Model for the Threshold Voltage of Short-Channel Double-Material-Gate (DMG) MOSFETs with a Strained-Silicon (s-Si) Channel on Silicon-Germanium (SiGe) Substrates
Bhushan, Shiv, Sarangi, Santunu, Gopi, Krishna Saramekala, Santra, Abirmoya, Dubey, Sarvesh, Tiwari, Pramod Kumar
Published in Journal of semiconductor technology and science (2013)
Get full text
Published in Journal of semiconductor technology and science (2013)
Journal Article
A rigorous simulation based study of gate misalignment effects in gate engineered double-gate (DG) MOSFETs
Sarangi, Santunu, Bhushan, Shiv, Santra, Abirmoya, Dubey, Sarvesh, Jit, Satyabrata, Tiwari, Pramod Kumar
Published in Superlattices and microstructures (01.08.2013)
Published in Superlattices and microstructures (01.08.2013)
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Journal Article
A 10 Gb/s On-chip Jitter Measurement Circuit Based on Transition Region Scanning Method
Sarangi, Santunu, Som, Indranil, Bhattacharyya, T K
Published in 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) (01.02.2022)
Published in 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) (01.02.2022)
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Conference Proceeding
A compact SPI-based SRAM in 0.6um CMOS for Low-Power IoT Applications
Swain, Prasant Kumar, Sarangi, Santunu, Rout, Saroj
Published in 2023 1st International Conference on Circuits, Power and Intelligent Systems (CCPIS) (01.09.2023)
Published in 2023 1st International Conference on Circuits, Power and Intelligent Systems (CCPIS) (01.09.2023)
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Conference Proceeding
A simulation-based study of gate misalignment effects in triple-material double-gate (TMDG) MOSFETs
Sarangi, Santunu, Bhushan, Shiv, Krishna, S. Gopi, Santra, Abirmoya, Tiwari, P. K.
Published in 2013 International Mutli-Conference on Automation, Computing, Communication, Control and Compressed Sensing (iMac4s) (01.03.2013)
Published in 2013 International Mutli-Conference on Automation, Computing, Communication, Control and Compressed Sensing (iMac4s) (01.03.2013)
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Conference Proceeding