Simulating human sleep spindle MEG and EEG from ion channel and circuit level dynamics
Rosen, B.Q., Krishnan, G.P., Sanda, P., Komarov, M., Sejnowski, T., Rulkov, N., Ulbert, I., Eross, L., Madsen, J., Devinsky, O., Doyle, W., Fabo, D., Cash, S., Bazhenov, M., Halgren, E.
Published in Journal of neuroscience methods (15.03.2019)
Published in Journal of neuroscience methods (15.03.2019)
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Journal Article
Soft-error resilience of the IBM POWER6 processor
Sanda, P N, Kellington, J W, Kudva, P, Kalla, R, McBeth, R B, Ackaret, J, Lockwood, R, Schumann, J, Jones, C R
Published in IBM journal of research and development (01.05.2008)
Published in IBM journal of research and development (01.05.2008)
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Journal Article
Experimental and theoretical insight into the electronic properties of 4‐aryl‐5‐arylazo‐3‐cyano‐6‐hydroxy‐2‐pyridone dyes
Vitnik, Vesna D., Vitnik, Željko J., Božić, Bojan Đ., Valentić, Nataša V., Dilber, Sanda P., Mijin, Dušan Ž., Ušćumlić, Gordana S.
Published in Coloration technology (01.06.2017)
Published in Coloration technology (01.06.2017)
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Journal Article
Docking Studies and α-Substitution Effects on the Anti-Inflammatory Activity of β-Hydroxy-β-arylpropanoic Acids
Savić, Jelena S, Dilber, Sanda P, Marković, Bojan D, Milenković, Marina T, Vladimirov, Sote M, Juranić, Ivan O
Published in Molecules (Basel, Switzerland) (05.08.2011)
Published in Molecules (Basel, Switzerland) (05.08.2011)
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Journal Article
Phaser: Phased methodology for modeling the system-level effects of soft errors
Rivers, J A, Bose, P, Kudva, P, Wellman, J-D, Sanda, P N, Cannon, E H, Alves, L C
Published in IBM journal of research and development (01.05.2008)
Published in IBM journal of research and development (01.05.2008)
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Journal Article
Soft-error resilience of the IBM POWER6 processor input/output subsystem
Bender, C, Sanda, P N, Kudva, P, Mata, R, Pokala, V, Haraden, R, Schallhorn, M
Published in IBM journal of research and development (01.05.2008)
Published in IBM journal of research and development (01.05.2008)
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Journal Article
Implementation of a self-resetting CMOS 64-bit parallel adder with enhanced testability
Wei Hwang, Gristede, G., Sanda, P., Wang, S.Y., Heidel, D.F.
Published in IEEE journal of solid-state circuits (01.08.1999)
Published in IEEE journal of solid-state circuits (01.08.1999)
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Journal Article
Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence
Polonsky, S., Knebel, D., Sanda, P., McManus, M., Huott, W., Pelella, A., Manzer, D., Steen, S., Wilson, S., Yuen Chan
Published in 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056) (2000)
Published in 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056) (2000)
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Conference Proceeding
Journal Article
Neonatal mortality at Tsevie hospital (Togo)
Djadou, K-E, Azouma, D, Yable, G, Dakey, G, Sanda, P, Dokounor, D, Atakouma, Y-D
Published in Archives de pédiatrie : organe officiel de la Société française de pédiatrie (01.08.2006)
Published in Archives de pédiatrie : organe officiel de la Société française de pédiatrie (01.08.2006)
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Journal Article
Optical and electrical testing of latchup in I/O interface circuits
Stellari, F., Peilin Song, McManus, M.K., Gauthier, R., Weger, A.J., Chatty, K., Muhammad, M., Sanda, P.
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)
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Conference Proceeding
Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis
Polonsky, S., McManus, M., Knebel, D., Steen, S., Sanda, P.
Published in Proceedings - Asian Test Symposium (2000)
Published in Proceedings - Asian Test Symposium (2000)
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Conference Proceeding
Journal Article
Diagnosis and characterization of timing-related defects by time-dependent light emission
Knebel, D., Sanda, P., McManus, M., Kash, J.A., Tsang, J.C., Vallett, D., Huisman, L., Nigh, P., Rizzolo, R., Peilin Song, Motika, F.
Published in Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) (1998)
Published in Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) (1998)
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Conference Proceeding