High Speed Serial Links Risk Assessment in Industrial Post-Silicon Validation Exploiting Machine Learning Techniques
Sanchez-Martinez, Cesar A., Lopez-Meyer, Paulo, Juarez-Hernandez, Esdras, Desiga-Orenday, Aaron, Viveros-Wacher, Andres
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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