Search Results - "San Andrés, Enrique" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

High‑k Gate Stacks on Low Bandgap Tensile Strained Ge and GeSn Alloys for Field-Effect Transistors

High‑k Gate Stacks on Low Bandgap Tensile Strained Ge and GeSn Alloys for Field-Effect Transistors

by Wirths, Stephan, Stange, Daniela, Pampillón, Maria-Angela, Tiedemann, Andreas T, Mussler, Gregor, Fox, Alfred, Breuer, Uwe, Baert, Bruno, San Andrés, Enrique, Nguyen, Ngoc D, Hartmann, Jean-Michel, Ikonic, Zoran, Mantl, Siegfried, Buca, Dan
Published in ACS applied materials & interfaces (14.01.2015)

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A Reliable Metric for Mobility Extraction of Short-Channel MOSFETs

A Reliable Metric for Mobility Extraction of Short-Channel MOSFETs

by Severi, S., Pantisano, L., Augendre, E., San Andres, E., Eyben, P., De Meyer, K.
Published in IEEE transactions on electron devices (01.10.2007)

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New Developments in Charge Pumping Measurements on Thin Stacked Dielectrics

New Developments in Charge Pumping Measurements on Thin Stacked Dielectrics

by Toledano-Luque, M., Degraeve, R., Zahid, M.B., Pantisano, L., San Andres, E., Groeseneken, G., De Gendt, S.
Published in IEEE transactions on electron devices (01.11.2008)

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Optical, Electrical, and Optoelectronic Characterization of Ti‐Supersaturated Gallium Arsenide

Optical, Electrical, and Optoelectronic Characterization of Ti‐Supersaturated Gallium Arsenide

by Algaidy, Sari, Caudevilla, Daniel, Godoy‐Pérez, Guillermo, Benítez‐Fernández, Rafael, Pérez‐Zenteno, Francisco, Duarte‐Cano, Sebastián, García‐Hernansanz, Rodrigo, San Andrés, Enrique, García‐Hemme, Eric, Olea, Javier, Siegel, Jan, Gonzalo, José, Pastor, David, del Prado, Álvaro
Published in Physica status solidi. A, Applications and materials science (26.04.2024)

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Thermal Assessment of AlGaN/GaN MOS-HEMTs on Si Substrate Using Gd2O3 as Gate Dielectric

Thermal Assessment of AlGaN/GaN MOS-HEMTs on Si Substrate Using Gd2O3 as Gate Dielectric

by Gao, Zhan, Romero, Maria Fatima, Pampillon, Maria Angela, San Andres, Enrique, Calle, Fernando
Published in IEEE transactions on electron devices (01.07.2016)

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Electrical characterization of gadolinium oxide deposited by high pressure sputtering with in situ plasma oxidation

Electrical characterization of gadolinium oxide deposited by high pressure sputtering with in situ plasma oxidation

by Pampillón, María Ángela, Feijoo, Pedro Carlos, San Andrés, Enrique
Published in Microelectronic engineering (01.09.2013)

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Electrical characterization of gadolinium oxide deposited by high pressure sputtering with in situ plasma oxidation

Electrical characterization of gadolinium oxide deposited by high pressure sputtering with in situ plasma oxidation

by Pampillón, María Ángela, Feijoo, Pedro Carlos, Enrique San Andrés
Published in arXiv.org (30.01.2024)

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High-k gadolinium scandate on Si obtained by high pressure sputtering from metal targets and in-situ plasma oxidation

High-k gadolinium scandate on Si obtained by high pressure sputtering from metal targets and in-situ plasma oxidation

by Pampillón, María Ángela, Enrique San Andrés, Feijoo, Pedro Carlos, Fierro, José Luis G
Published in arXiv.org (29.01.2024)

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Gadolinium scandate by high-pressure sputtering for future generations of high-k dielectrics

Gadolinium scandate by high-pressure sputtering for future generations of high-k dielectrics

by Feijoo, Pedro Carlos, Pampillón, María Ángela, Enrique San Andrés, Fierro, José Luis G
Published in arXiv.org (29.01.2024)

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Optimization of gadolinium oxide growth deposited on Si by high pressure sputtering

Optimization of gadolinium oxide growth deposited on Si by high pressure sputtering

by Feijoo, Pedro Carlos, Pampillón, María Ángela, Enrique San Andrés
Published in arXiv.org (29.01.2024)

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Optimization of scandium oxide growth by high pressure sputtering on silicon

Optimization of scandium oxide growth by high pressure sputtering on silicon

by Feijoo, Pedro Carlos, Pampillón, María Ángela, Enrique San Andrés, Lucía, María Luisa
Published in arXiv.org (29.01.2024)

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High permittivity gadolinium oxide deposited on indium phosphide by high-pressure sputtering without interface treatments

High permittivity gadolinium oxide deposited on indium phosphide by high-pressure sputtering without interface treatments

by San Andrés, Enrique, Pampillón, María Ángela, Feijoo, Pedro Carlos, Pérez, Raúl, Cañadilla, Carmina
Published in Microelectronic engineering (01.09.2013)

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Anomalous thermal oxidation of gadolinium thin films deposited on silicon by high pressure sputtering

Anomalous thermal oxidation of gadolinium thin films deposited on silicon by high pressure sputtering

by Pampillón, María Ángela, Feijoo, Pedro Carlos, Enrique San Andrés, Lucía, María Luisa, Toledano-Luque, María
Published in arXiv.org (29.01.2024)

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Time-Dependent Dielectric Breakdown on Subnanometer EOT nMOS FinFETs

Time-Dependent Dielectric Breakdown on Subnanometer EOT nMOS FinFETs

by Feijoo, Pedro C, Kauerauf, Thomas, Toledano-Luque, María, Togo, Mitsuhiro, Enrique San Andrés, Groeseneken, Guido
Published in arXiv.org (29.01.2024)

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Towards metal electrode interface scavenging of rare-earth scandates: A Sc2O3 and Gd2O3 study

Towards metal electrode interface scavenging of rare-earth scandates: A Sc2O3 and Gd2O3 study

by Pampillón, María Ángela, Feijoo, Pedro Carlos, Enrique San Andrés, Toledano-Luque, María, Álvaro del Prado, Blázquez, Antonio, Lucía, María Luisa
Published in arXiv.org (29.01.2024)

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High Pressure Sputtering For Kigh-k Dielectric Deposition. Is It Worth Trying?

High Pressure Sputtering For Kigh-k Dielectric Deposition. Is It Worth Trying?

by Enrique San Andrés, Feijoo, Pedro Carlos, Pampillón, María Ángela, Lucía, María Luisa, Álvaro del Prado
Published in arXiv.org (29.01.2024)

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Native Oxide Layer Role during Cryogenic‐Temperature Ion Implantations in Germanium

Native Oxide Layer Role during Cryogenic‐Temperature Ion Implantations in Germanium

by Caudevilla, Daniel, Pérez‐Zenteno, Francisco José, Duarte‐Cano, Sebastián, Algaidy, Sari, Benítez‐Fernández, Rafael, Godoy‐Pérez, Guilleromo, Olea, Javier, San Andrés, Enrique, García‐Hernansanz, Rodrigo, del Prado, Álvaro, Mártil, Ignacio, Pastor, David, García‐Hemme, Eric
Published in Physica status solidi. A, Applications and materials science (08.07.2024)

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On the Optoelectronic Mechanisms Ruling Ti‐hyperdoped Si Photodiodes

On the Optoelectronic Mechanisms Ruling Ti‐hyperdoped Si Photodiodes

by García‐Hemme, Eric, Caudevilla, Daniel, Algaidy, Sari, Pérez‐Zenteno, Francisco, García‐Hernansanz, Rodrigo, Olea, Javier, Pastor, David, del Prado, Álvaro, San Andrés, Enrique, Mártil, Ignacio, González‐Díaz, Germán
Published in Advanced electronic materials (01.02.2022)

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Electrical characterization of gadolinium oxide deposited by high pressure sputtering with in situ plasma oxidation: Insulating Films on Semiconductors 2013

Electrical characterization of gadolinium oxide deposited by high pressure sputtering with in situ plasma oxidation: Insulating Films on Semiconductors 2013

by ÁNGELA PAMPILLÓN, María, FEIJOO, Pedro Carlos, SAN ANDRÉS, Enrique
Published in Microelectronic engineering (2013)

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Accurate gate impedance determination on ultraleaky MOSFETs by fitting to a three-lumped-parameter model at frequencies from DC to RF

Accurate gate impedance determination on ultraleaky MOSFETs by fitting to a three-lumped-parameter model at frequencies from DC to RF

by SAN ANDRES, Enrique, PANTISANO, Luigi, RAMOS, Javier, ROUSSEL, Philippe J, O'SULLIVAN, Barry J, TOLEDANO-LUQUE, Maria, DEGENDT, Stefan, GROESENEKEN, Guido
Published in IEEE transactions on electron devices (01.07.2007)

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