Time gating imaging through thick silicon substrate: a new step towards backside characterisation
Rampnoux, J.M., Michel, H., Salhi, M.A., Grauby, S., Claeys, W., Dilhaire, S.
Published in Microelectronics and reliability (01.09.2006)
Published in Microelectronics and reliability (01.09.2006)
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Journal Article
Conference Proceeding
Localisation of devices acting as heat sources in ICs covered entirely by metal layers
Altet, J., Salhi, M.A., Dilhaire, S., Syal, A., Ivanov, A.
Published in Electronics letters (02.10.2003)
Published in Electronics letters (02.10.2003)
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Journal Article
Confocal THz imaging using a gas laser
Salhi, M.A., Koch, M.
Published in 2008 33rd International Conference on Infrared, Millimeter and Terahertz Waves (01.09.2008)
Published in 2008 33rd International Conference on Infrared, Millimeter and Terahertz Waves (01.09.2008)
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Conference Proceeding
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers
Aldrete-Vidrio, E., Salhi, M.A., Altet, J., Grauby, S., Mateo, D., Michel, H., Clerjaud, L., Rampnoux, J.M., Rubio, A., Claeys, W., Dilhaire, S.
Published in 2008 13th European Test Symposium (01.05.2008)
Published in 2008 13th European Test Symposium (01.05.2008)
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Conference Proceeding
Direct recovering of Nth order surface structure using UOFF approach
Shi, Y.Q., Shu, C.Q., Salhi, M.A.
Published in 1992 IEEE International Symposium on Circuits and Systems (ISCAS) (1992)
Published in 1992 IEEE International Symposium on Circuits and Systems (ISCAS) (1992)
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Conference Proceeding