A new model for predicting the effect of temperature and devices dimension on threshold voltage of PMOS in VLSI
Ruangphanit, A., Poyai, A., Sakuna, N., Niemcharoen, S., Muanghlua, R.
Published in 2015 12th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON) (01.06.2015)
Published in 2015 12th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON) (01.06.2015)
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Conference Proceeding
Implementation of the temperature and narrow channel dependence on threshold voltage model of NMOSFETs
Ruangphanit, A., Sakuna, N., Niemcharoen, Phinyo, B., Muanghlua, R.
Published in The 4th Joint International Conference on Information and Communication Technology, Electronic and Electrical Engineering (JICTEE) (01.03.2014)
Published in The 4th Joint International Conference on Information and Communication Technology, Electronic and Electrical Engineering (JICTEE) (01.03.2014)
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Conference Proceeding
Temperature and devices dimension dependence on threshold voltage, the low field mobilty and the series parasitic resistance of PMOSFET
Sakuna, N., Muanghlua, R., Niemcharoen, S., Ruangphanit, A., Poyai, A.
Published in 2013 10th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (01.05.2013)
Published in 2013 10th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (01.05.2013)
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Conference Proceeding