Resistance Controllability of \hbox \hbox/\hbox Stack ReRAM for Low-Voltage and Multilevel Operation
Terai, M., Sakotsubo, Y., Kotsuji, S., Hada, H.
Published in IEEE electron device letters (01.03.2010)
Published in IEEE electron device letters (01.03.2010)
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Journal Article
A new approach for improving operating margin of unipolar ReRAM using local minimu m of reset voltage
Sakotsubo, Y, Terai, M, Kotsuji, S, Saito, Y, Tada, M, Yabe, Y, Hada, H
Published in 2010 Symposium on VLSI Technology (01.06.2010)
Published in 2010 Symposium on VLSI Technology (01.06.2010)
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Conference Proceeding
High thermal robust ReRAM with a new method for suppressing read disturb
Terai, M., Saitoh, M., Nagumo, T., Sakotsubo, Y., Yabe, Y., Takeda, K., Hase, T.
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
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Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
Conference Proceeding
Tunneling spectroscopy of isolated gold clusters grown on thiol/dithiol mixed self-assembled monolayers
Sakotsubo, Yukihiro, Ohgi, Taizo, Fujita, Daisuke, Ootuka, Youiti
Published in Physica. E, Low-dimensional systems & nanostructures (01.11.2005)
Published in Physica. E, Low-dimensional systems & nanostructures (01.11.2005)
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Journal Article
Conference Proceeding
Growth and characterization of isolated nanoclusters on mixed self-assembled monolayers
Sakotsubo, Yukihiro, Ohgi, Taizo, Fujita, Daisuke, Ootuka, Youiti
Published in Applied surface science (28.02.2005)
Published in Applied surface science (28.02.2005)
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Journal Article
Conference Proceeding
Capacitance dependence of chemical potential distribution in supported nanoclusters
Ohgi, Taizo, Sakotsubo, Yukihiro, Fujita, Daisuke, Ootuka, Youiti
Published in Surface science (20.09.2004)
Published in Surface science (20.09.2004)
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Journal Article
Effect of bottom electrode of ReRAM with Ta2O5/TiO2 stack on RTN and retention
Terai, M., Sakotsubo, Y., Saito, Y., Kotsuji, S., Hada, H.
Published in 2009 IEEE International Electron Devices Meeting (IEDM) (01.12.2009)
Published in 2009 IEEE International Electron Devices Meeting (IEDM) (01.12.2009)
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Conference Proceeding