XAFS measurement of gallium in DLC thin film fabricated by FIB-CVD method
Saikubo, A., Igaki, J., Kometani, R., Kanda, K., Matsui, S.
Published in Diamond and related materials (01.04.2008)
Published in Diamond and related materials (01.04.2008)
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Journal Article
Conference Proceeding
Fabrication of fluorocarbon terminated DLC thin film using soft X-ray
Yamada, N., Kanda, K., Saikubo, A., Niibe, M., Haruyama, Y., Matsui, S.
Published in Diamond and related materials (01.04.2008)
Published in Diamond and related materials (01.04.2008)
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Journal Article
Conference Proceeding
High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope
Koyama, Takahisa, Kagoshima, Yasushi, Wada, Izumi, Saikubo, Akihiko, Shimose, Kenichi, Hayashi, Kenji, Tsusaka, Yoshiyuki, Matsui, Junji
Published in Japanese Journal of Applied Physics (15.03.2004)
Published in Japanese Journal of Applied Physics (15.03.2004)
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Journal Article
Scanning Differential-Phase-Contrast Hard X-Ray Microscopy with Wedge Absorber Detector
Kagoshima, Yasushi, Shimose, Ken-ich, Koyama, Takahisa, Wada, Izumi, Saikubo, Akihiko, Hayashi, Kenji, Tsusaka, Yoshiyuki, Matsui, Junji
Published in Japanese Journal of Applied Physics (01.11.2004)
Published in Japanese Journal of Applied Physics (01.11.2004)
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Journal Article
Soft X-ray emission and absorption spectra of DLC film formed by FIB-CVD method
Saikubo, A., Igaki, J., Kato, Y., Kometani, R., Kanda, K., Matsui, S.
Published in Digest of Papers Microprocesses and Nanotechnology 2005 (2005)
Published in Digest of Papers Microprocesses and Nanotechnology 2005 (2005)
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Conference Proceeding