by Fongral, M., Pouget, V., Saigne, F., Ruffenach, M., Carron, J., Malou, F., Mekki, J.
Published in IEEE transactions on nuclear science (01.08.2024)

by Wrobel, F., Dilillo, L., Touboul, A. D., Pouget, V., Saigné, F.
Published in IEEE transactions on nuclear science (01.08.2014)

by Niskanen, K., Touboul, A. D., Germanicus, R. Coq, Michez, A., Javanainen, A., Wrobel, F., Boch, J., Pouget, V., Saigne, F.
Published in IEEE transactions on nuclear science (01.07.2020)

by Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Puchner, H., Frost, C., Wrobel, F., Saigné, F.
Published in IEEE transactions on nuclear science (01.08.2014)

by Aguiar, Y. Q., Wrobel, F., Autran, J.-L., Kastensmidt, F. L., Leroux, P., Saigne, F., Pouget, V., Touboul, A. D.
Published in IEEE transactions on nuclear science (01.07.2020)

by Zimmaro, A., Ferraro, R., Boch, J., Saigne, F., Masi, A., Danzeca, S.
Published in Journal of instrumentation (01.02.2024)

by Da Costa Lopes, I., Pouget, V., Wrobel, F., Touboul, A., Saigne, F., Roed, K.
Published in IEEE transactions on nuclear science (01.07.2022)

by Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Mekki, J., Brugger, M., Wrobel, F., Saigné, F.
Published in IEEE transactions on nuclear science (01.08.2014)

by Niskanen, K., Coq Germanicus, R., Michez, A., Wrobel, F., Boch, J., Saigne, F., Touboul, A. D.
Published in IEEE transactions on nuclear science (01.08.2021)

by Rajkowski, T., Saigne, F., Pouget, V., Wrobel, F., Touboul, A., Boch, J., Kohler, P., Dubus, P., Wang, P. X.
Published in IEEE transactions on nuclear science (01.07.2020)

by Aguiar, Y.Q., Wrobel, F., Guagliardo, S., Autran, J.-L., Leroux, P., Saigné, F., Touboul, A.D., Pouget, V.
Published in Microelectronics and reliability (01.09.2019)

by Kohler, P., Pouget, V., Wrobel, F., Saigne, F., Wang, P. X., Vassal, M.-C.
Published in IEEE transactions on nuclear science (01.01.2018)

by Reed, R. A., Weller, R. A., Akkerman, A., Barak, J., Culpepper, W., Duzellier, S., Foster, C., Gaillardin, M., Hubert, G., Jordan, T., Jun, I., Koontz, S., Lei, F., McNulty, P., Mendenhall, M. H., Murat, M., Nieminen, P., O'Neill, P., Raine, M., Reddell, B., Saigne, F., Santin, G., Sihver, L., Tang, H. H. K., Truscott, P. R., Wrobel, F.
Published in IEEE transactions on nuclear science (01.06.2013)

by Scialdone, A., Gkountoumis, P., Ferraro, R., Barros Marin, M., Dilillo, L., Saigne, F., Boch, J., Danzeca, S., Masi, A.
Published in Journal of instrumentation (01.01.2024)

by Aguiar, Y.Q., Wrobel, F., Autran, J.-L., Leroux, P., Saigné, F., Touboul, A.D., Pouget, V.
Published in Microelectronics and reliability (01.09.2018)

by Aguiar, Y. Q., Wrobel, F., Autran, J.-L., Leroux, P., Saigne, F., Touboul, A. D., Pouget, V.
Published in IEEE transactions on nuclear science (01.07.2019)

by Bosser, A., Gupta, V., Tsiligiannis, G., Javanainen, A., Kettunen, H., Puchner, H., Saigne, F., Virtanen, A., Wrobel, F., Dilillo, L.
Published in IEEE transactions on nuclear science (01.12.2015)

by Foro, L. L., Touboul, A. D., Michez, A., Wrobel, F., Rech, P., Dilillo, L., Frost, C., Saigné, F.
Published in IEEE transactions on nuclear science (01.08.2014)

by Boch, J., Michez, A., Rousselet, M., Dhombres, S., Touboul, A. D., Vaille, J-R, Dusseau, L., Lorfevre, E., Chatry, N., Sukhaseum, N., Saigne, F.
Published in IEEE transactions on nuclear science (01.08.2016)

by Roig, Fabien, Dusseau, L., Ribeiro, P., Auriel, G., Roche, N. J.-H, Privat, A., Vaillé, J.-R, Boch, J., Saigné, F., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R., Azais, B.
Published in IEEE transactions on nuclear science (01.08.2014)