Direct-current measurements of oxide and interface traps on oxidized silicon
Neugroschel, A., Chih-Tang Sah, Han, K.M., Carroll, M.S., Nishida, T., Kavalieros, J.T., Yi Lu
Published in IEEE transactions on electron devices (01.09.1995)
Published in IEEE transactions on electron devices (01.09.1995)
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Journal Article
Degradation of silicon bipolar junction transistors at high forward current densities
Carroll, M.S., Neugroschel, A., Chih-Tang Sah
Published in IEEE transactions on electron devices (01.01.1997)
Published in IEEE transactions on electron devices (01.01.1997)
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Journal Article
Temperature dependence of surface recombination current in MOS transistors
Yih Wang, Neugroschel, A., Chih-Tang Sah
Published in IEEE transactions on electron devices (01.09.2001)
Published in IEEE transactions on electron devices (01.09.2001)
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Journal Article
Degradation of bipolar transistor current gain by hot holes during reverse emitter-base bias stress
Neugroschel, A., Chih-Tang Sah, Carroll, M.S.
Published in IEEE transactions on electron devices (01.08.1996)
Published in IEEE transactions on electron devices (01.08.1996)
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Journal Article
Comparison of time-to-failure of GeSi and Si bipolar transistors
Neugroschel, A., Chih-Tang Sah, Ford, J.M., Steele, J., Tang, R., Stein, C.
Published in IEEE electron device letters (01.05.1996)
Published in IEEE electron device letters (01.05.1996)
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Journal Article
Profiling interface traps in MOS transistors by the DC current-voltage method
Chih-Tang Sah, Neugroschel, A., Han, K.M., Kavalieros, J.T.
Published in IEEE electron device letters (01.02.1996)
Published in IEEE electron device letters (01.02.1996)
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Journal Article
Accelerated reverse emitter-base bias stress methodologies and time-to-failure application
Neugroschel, A., Chih-Tang Sah, Carroll, M.S.
Published in IEEE electron device letters (01.03.1996)
Published in IEEE electron device letters (01.03.1996)
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Journal Article