Recognizing Named Entities in Failure Analysis Reports
Grabner, Corinna, Safont-Andreu, Anna, Burmer, Christian, Hollerith, Christian, Schekotihin, Konstantin
Published in 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (24.07.2023)
Published in 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (24.07.2023)
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Conference Proceeding
AI-Based Knowledge Management System for Risk Assessment and Root Cause Analysis in Semiconductor Industry
Razouk, Houssam, Kern, Roman, Mischitz, Martin, Moser, Josef, Memic, Mirhad, Liu, Lan, Burmer, Christian, Safont-Andreu, Anna
Published in Artificial Intelligence for Digitising Industry (2021)
Published in Artificial Intelligence for Digitising Industry (2021)
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Book Chapter
Artificial Intelligence Applications in Semiconductor Failure Analysis
Safont-Andreu, Anna, Schekotihin, Konstantin, Burmer, Christian, Hollerith, Christian, Ming, Xue
Published in Electronic device failure analysis (01.05.2023)
Published in Electronic device failure analysis (01.05.2023)
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Magazine Article