Stress-Aware Periodic Test of Interconnects
Sadeghi-Kohan, Somayeh, Hellebrand, Sybille, Wunderlich, Hans-Joachim
Published in Journal of electronic testing (01.12.2021)
Published in Journal of electronic testing (01.12.2021)
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Journal Article
Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects
Sadeghi-Kohan, Somayeh, Hellebrand, Sybille
Published in 2020 IEEE 38th VLSI Test Symposium (VTS) (01.04.2020)
Published in 2020 IEEE 38th VLSI Test Symposium (VTS) (01.04.2020)
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Conference Proceeding
Self-Adjusting Monitor for Measuring Aging Rate and Advancement
Sadeghi-Kohan, Somayeh, Kamal, Mehdi, Navabi, Zainalabedin
Published in IEEE transactions on emerging topics in computing (01.07.2020)
Published in IEEE transactions on emerging topics in computing (01.07.2020)
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Journal Article
Optimizing the Streaming of Sensor Data with Approximate Communication
Sadeghi-Kohan, Somayeh, Reimer, Jan Dennis, Hellebrand, Sybille, Wunderlich, Hans-Joachim
Published in 2023 IEEE 32nd Asian Test Symposium (ATS) (14.10.2023)
Published in 2023 IEEE 32nd Asian Test Symposium (ATS) (14.10.2023)
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Conference Proceeding
Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study
Sprenger, Alexander, Sadeghi-Kohan, Somayeh, Reimer, Jan Dennis, Hellebrand, Sybille
Published in 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (19.10.2020)
Published in 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (19.10.2020)
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Conference Proceeding
Approximate Communication: Balancing Performance, Power, Reliability, and Safety
Badran, Abdalrhman, Sadeghi-Kohan, Somayeh, Reimer, Jan Dennis, Hellebrand, Sybille
Published in 2023 IEEE European Test Symposium (ETS) (22.05.2023)
Published in 2023 IEEE European Test Symposium (ETS) (22.05.2023)
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Conference Proceeding
Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication
Sadeghi-Kohan, Somayeh, Hellebrand, Sybille, Wunderlich, Hans-Joachim
Published in 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W) (01.06.2023)
Published in 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W) (01.06.2023)
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Conference Proceeding
BS 1149.1 extensions for an online interconnect fault detection and recovery
Sadeghi-Kohan, Somayeh, Namaki-Shoushtari, M., Javaheri, F., Navabi, Z.
Published in 2012 IEEE International Test Conference (01.11.2012)
Published in 2012 IEEE International Test Conference (01.11.2012)
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Conference Proceeding
Universal mitigation of NBTI-induced aging by design randomization
Jenihhin, Maksim, Kamkin, Alexander, Navabi, Zainalabedin, Sadeghi-Kohan, Somayeh
Published in 2016 IEEE East-West Design & Test Symposium (EWDTS) (01.10.2016)
Published in 2016 IEEE East-West Design & Test Symposium (EWDTS) (01.10.2016)
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Conference Proceeding
Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation
Sadeghi-Kohan, Somayeh, Kamran, Arezoo, Forooghifar, Farnaz, Navabi, Zainalabedin
Published in 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (01.04.2015)
Published in 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (01.04.2015)
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Conference Proceeding
An off-line MDSI interconnect BIST incorporated in BS 1149.1
Mohammadi, Marzieh, Sadeghi-Kohan, Somayeh, Masoumi, Nasser, Navabi, Zainalabedin
Published in 2014 19th IEEE European Test Symposium (ETS) (01.05.2014)
Published in 2014 19th IEEE European Test Symposium (ETS) (01.05.2014)
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Conference Proceeding
Online self adjusting progressive age monitoring of timing variations
Sadeghi-Kohan, Somayeh, Kamal, Mehdi, McNeil, John, Prinetto, Paolo, Navabi, Zain
Published in 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (01.04.2015)
Published in 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (01.04.2015)
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Conference Proceeding
Improving polynomial datapath debugging with HEDs
Sadeghi-Kohan, Somayeh, Behnam, Payman, Alizadeh, Bijan, Fujita, Masahiro, Navabi, Zainalabedin
Published in 2014 19th IEEE European Test Symposium (ETS) (01.05.2014)
Published in 2014 19th IEEE European Test Symposium (ETS) (01.05.2014)
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Conference Proceeding
A new structure for interconnect offline testing
Sadeghi-Kohan, Somayeh, Keshavarz, Shahrzad, Zokaee, Farzaneh, Farahmandi, Farimah, Navabi, Zainalabedin
Published in East-West Design & Test Symposium (EWDTS 2013) (01.09.2013)
Published in East-West Design & Test Symposium (EWDTS 2013) (01.09.2013)
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Conference Proceeding
Virtual tester development using HDL/PLI
Kamran, Arezoo, Nemati, Nastaran, Kohan, Somayeh Sadeghi, Navabi, Zainalabedin
Published in 2010 East-West Design & Test Symposium (EWDTS) (01.09.2010)
Published in 2010 East-West Design & Test Symposium (EWDTS) (01.09.2010)
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Conference Proceeding
Workload-Aware Periodic Interconnect BIST
Sadeghi-Kohan, Somayeh, Hellebrand, Sybille, Wunderlich, Hans-Joachim
Published in IEEE design and test (01.08.2024)
Published in IEEE design and test (01.08.2024)
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Magazine Article