by Bashir, R., Hebert, F., DeSantis, J., McGregor, J.M., Yindeepol, W., Brown, K., Moraveji, F., Mills, T.B., Sadovnikov, A., McGinty, J., Hopper, P., Sabsowitz, R., Khidr, M., Krakowski, T., Smith, L., Razouk, R.
Published in IEEE transactions on electron devices (01.11.2001)