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METHODS AND SYSTEMS FOR INLINE PARTS AVERAGE TESTING AND LATENT RELIABILITY DEFECT DETECTION
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Year of Publication 27.09.2018
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Year of Publication 27.09.2018
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Methods and systems for inline parts average testing and latent reliability defect detection
RATHERT, ROBERT J, CAPPEL, ROBERT, SHERMAN, KARA L, PRICE, DAVID W, SUTHERLAND, DOUGLAS G
Year of Publication 21.05.2023
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Year of Publication 21.05.2023
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Methods and systems for inline parts average testing and latent reliability defect detection
RATHERT ROBERT J, SHERMAN KARA L, SUTHERLAND DOUGLAS G, PRICE DAVID W, CAPPEL ROBERT
Year of Publication 05.11.2019
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Year of Publication 05.11.2019
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Methods and systems for inline parts average testing and latent reliability defect detection
RATHERT, ROBERT J, CAPPEL, ROBERT, SHERMAN, KARA L, PRICE, DAVID W, SUTHERLAND, DOUGLAS G
Year of Publication 16.01.2019
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Year of Publication 16.01.2019
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Stoichiometry reversal and depth-profiling in the growth of thin oxynitride films with N2O on Si(100) surfaces
Sutherland, D.G.J., Akatsu, H., Copel, M., Himpsel, F.J., Callcott, T., Carlisle, J.A., Ederer, D., Jia, J.J., Jimenez, I., Perera, R., Shuh, D.K., Terminello, L.J., Tong, W.M.
Published in Journal of electron spectroscopy and related phenomena (01.05.1996)
Published in Journal of electron spectroscopy and related phenomena (01.05.1996)
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Himpsel, F.J., Akatsu, H., Carlisle, J.A., Sutherland, D.G.J., Jimenez, I., Terminello, L.J., Jia, J.J., Callcott, T.A., Samant, M.G., Stöhr, J., Ederer, D.L., Perera, R.C.C., Tong, W., Shunh, D.K.
Published in Progress in surface science (01.09.1995)
Published in Progress in surface science (01.09.1995)
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