Point defects generated by oxidation of silicon crystal surface
Suezawa, M., Yamamoto, Y., Suemitsu, M., Yonenaga, I.
Published in Physica. B, Condensed matter (15.12.2009)
Published in Physica. B, Condensed matter (15.12.2009)
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Journal Article
Complexes of point defects and impurities in electron-irradiated n-type Cz-Si pre-doped with hydrogen
Nakanishi, A., Fukata, N., Suezawa, M.
Published in Physica status solidi. B. Basic research (01.01.2003)
Published in Physica status solidi. B. Basic research (01.01.2003)
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Journal Article
Conference Proceeding
ESR signature of tetra-interstitial defect in silicon
Mchedlidze, T., Yonenaga, I., Suezawa, M.
Published in Materials science in semiconductor processing (01.10.2003)
Published in Materials science in semiconductor processing (01.10.2003)
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Journal Article
Electron-beam-induced-current study of artificial twist boundaries in bonded Si wafers
Ikeda, K., Sekiguchi, T., Ito, S., Takebe, M., Suezawa, M.
Published in Journal of crystal growth (01.03.2000)
Published in Journal of crystal growth (01.03.2000)
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Journal Article
Conference Proceeding