Efficient Spectral Testing With Clipped and Noncoherently Sampled Data
Li Xu, Sudani, Siva Kumar, Degang Chen
Published in IEEE transactions on instrumentation and measurement (01.06.2014)
Published in IEEE transactions on instrumentation and measurement (01.06.2014)
Get full text
Journal Article
ULTRA-LOW LEAKAGE DIODES USED FOR LOW INPUT BIAS CURRENT
VASAN, Bharath Karthik, SUDANI, Siva Kumar, WANG, YuGuo, DOORENBOS, Jerry L, PULIJALA, Srinivas Kumar
Year of Publication 31.08.2023
Get full text
Year of Publication 31.08.2023
Patent