Search Results - "SU CHANMIN" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof

Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof

by SU CHANMIN QUANMIN, WANG WEIJIE
Year of Publication 17.06.2014

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Patent

Device for mechanically cleaning nanoscale debris from sample surface and method of manufacture

Device for mechanically cleaning nanoscale debris from sample surface and method of manufacture

by SU CHANMIN, WANG WEIJIE, HU SHUIQING, OSBORNE, JASON
Year of Publication 31.03.2023

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Patent

SAMPLE VESSEL RETENTION FOR SCANNING PROBE MICROSCOPE

SAMPLE VESSEL RETENTION FOR SCANNING PROBE MICROSCOPE

by SU, Chanmin, MEYER, Charles, SHAW, James, HU, Shuiqing
Year of Publication 02.05.2018

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Patent

MINIATURIZED CANTILEVER PROBE FOR SCANNING PROBE MICROSCOPY AND FABRICATION THEREOF

MINIATURIZED CANTILEVER PROBE FOR SCANNING PROBE MICROSCOPY AND FABRICATION THEREOF

by SU CHANMIN QUANMIN, WANG WIEJIE
Year of Publication 06.03.2014

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Patent

MINIATURIZED CANTILEVER PROBE FOR SCANNING PROBE MICROSCOPY AND FABRICATION THEREOF

MINIATURIZED CANTILEVER PROBE FOR SCANNING PROBE MICROSCOPY AND FABRICATION THEREOF

by WANG, WIEJIE, SU, CHANMIN
Year of Publication 06.03.2014

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Patent

Vibration reduction holder applied to nanometer measuring/processing and nanometer measuring/processing system

Vibration reduction holder applied to nanometer measuring/processing and nanometer measuring/processing system

by LIU LIANQING, SU CHANMIN, YANG TIE, YANG YANG, ZHAI SHENGHANG, SHI JIALIN, YU PENG
Year of Publication 22.12.2023

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Patent

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIELD SPECTROSCOPY

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIELD SPECTROSCOPY

by MINNE STEPHEN, SU CHANMIN, ANDREEV GREGORY, OSECHINSKIY SERGEY
Year of Publication 21.01.2016

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Patent

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIELD SPECTROSCOPY

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIELD SPECTROSCOPY

by SU, Chanmin, ANDREEV, Gregory, MINNE, Stephen, OSECHINSKIY, Sergey
Year of Publication 20.01.2016

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Patent

FORCE MEASUREMENT WITH REAL-TIME BASELINE DETERMINATION

FORCE MEASUREMENT WITH REAL-TIME BASELINE DETERMINATION

by SU, Chanmin, LIU, Changchun, PITTENGER, Bede, HU, Shuiqing
Year of Publication 18.10.2017

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Patent

METHOD AND APPARATUS TO COMPENSATE FOR DEFLECTION ARTIFACTS IN AN ATOMIC FORCE MICROSCOPE

METHOD AND APPARATUS TO COMPENSATE FOR DEFLECTION ARTIFACTS IN AN ATOMIC FORCE MICROSCOPE

by HU, SHUIQING, SU, CHANMIN
Year of Publication 03.09.2015

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Patent

Method and Apparatus to Compensate for Deflection Artifacts in an Atomic Force Microscope

Method and Apparatus to Compensate for Deflection Artifacts in an Atomic Force Microscope

by SU CHANMIN, HU SHUIQING
Year of Publication 03.09.2015

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Patent

CLOSED LOOP CONTROLLER AND METHOD FOR FAST SCANNING PROBE MICROSCOPY

CLOSED LOOP CONTROLLER AND METHOD FOR FAST SCANNING PROBE MICROSCOPY

by PRATER, Craig, SU, Chanmin, SHI, Jian, MA, Ji
Year of Publication 02.08.2017

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Patent

Device, and method of manufacture, for use in mechanically cleaning nanoscale debris from a sample surface

Device, and method of manufacture, for use in mechanically cleaning nanoscale debris from a sample surface

by SU, CHANMIN, HU, SHUI-QING, OSBORNE, JASON, WANG, WEIJIE
Year of Publication 01.04.2022

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Patent

Non-destructive wafer-scale sub-surface ultrasonic microscopy employing near field AFM detection

Non-destructive wafer-scale sub-surface ultrasonic microscopy employing near field AFM detection

by PRATER CRAIG, SU CHANMIN
Year of Publication 04.12.2012

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Patent

TORSION WING PROBE ASSEMBLY

TORSION WING PROBE ASSEMBLY

by SU CHANMIN, WANG WEIJIE, HU SHUIQING, WAGNER MARTIN
Year of Publication 08.02.2022

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Patent

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIELD SPECTROSCOPY

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIELD SPECTROSCOPY

by ANDREEV, GREGORY, MINNE, STEPHEN, OSECHINSKIY, SERGEY, SU, CHANMIN
Year of Publication 24.04.2020

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Patent

METHOD AND APPARATUS OF AUTOMATIC SCANNING PROBE IMAGING

METHOD AND APPARATUS OF AUTOMATIC SCANNING PROBE IMAGING

by BELIKOV, SERGEY, SU, CHANMIN
Year of Publication 24.10.2012

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Patent

SAMPLE VESSEL RETENTION FOR SCANNING PROBE MICROSCOPE

SAMPLE VESSEL RETENTION FOR SCANNING PROBE MICROSCOPE

by SU, Chanmin, MEYER, Charles, SHAW, James, HU, Shuiqing
Year of Publication 29.12.2016

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Patent

FAST-SCANNING SPM AND METHOD OF OPERATING SAME

FAST-SCANNING SPM AND METHOD OF OPERATING SAME

by PHAN, Nghi, PRATER, Craig, SU, Chanmin, NAGLE, Steven, KINDT, Johannes, SHI, Jian, MARKAKIS, Jeffrey, FAN, Wenjun, CUSWORTH, Craig
Year of Publication 13.12.2017

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Patent

METHOD AND APPARATUS FOR OBTAINING QUANTITATIVE MEASUREMENTS USING A PROBE BASED INSTRUMENT

METHOD AND APPARATUS FOR OBTAINING QUANTITATIVE MEASUREMENTS USING A PROBE BASED INSTRUMENT

by SU, CHANMIN, PHAN, NGHI
Year of Publication 29.08.2012

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Patent

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