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"SU CHANMIN"
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"SU CHANMIN"
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Device, and Method of Manufacture, for use in Mechanically Cleaning Nanoscale Debris from a Sample Surface
by
Su
,
Chanmin
,
Wang, Weijie
,
Hu, Shuiqing
,
Osborne, Jason
Year of Publication
23.12.2021
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Peakforce Photothermal-Based Detection of IR Nanoabsorption
by
Su
,
Chanmin
,
Andreev, Gregory O
Year of Publication
19.04.2018
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Torsion wing probe assembly
by
Wagner, Martin
,
Su
,
Chanmin
,
Hu, Shuiqing
,
Wang, Weijie
Year of Publication
14.09.2021
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Method and apparatus of operating a scanning probe microscope
by
Hu, Yan
,
Su
,
Chanmin
,
Hu, Shuiqing
Year of Publication
10.12.2019
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Scanning probe microscopy utilizing separable components
by
Medalsy, Izhar
,
Su
,
Chanmin
,
Wang, Weijie
Year of Publication
09.07.2019
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PeakForce photothermal-based detection of IR nanoabsorption
by
Andreev Gregory O
,
Su Chanmin
Year of Publication
01.08.2017
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Torsion Wing Probe Assembly
by
Wagner, Martin
,
Su
,
Chanmin
,
Hu, Shuiqing
,
Wang, Weijie
Year of Publication
05.11.2020
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PeakForce Photothermal-Based Detection of IR Nanoabsorption
by
Andreev Gregory O
,
Su Chanmin
Year of Publication
23.02.2017
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SCANNING PROBE MICROSCOPY UTILIZING SEPARABLE COMPONENTS
by
Medalsy, Izhar
,
Su
,
Chanmin
,
Wang, Weijie
Year of Publication
18.10.2018
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Method and apparatus of using peak force tapping mode to measure physical properties of a sample
by
Shi, Jian
,
Hu, Yan
,
Su
,
Chanmin
,
Hu, Shuiqing
,
Ma, Ji
Year of Publication
26.05.2020
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Infrared Characterization of a Sample Using Oscillating Mode
by
Xu Xiaoji
,
Su Chanmin
,
Wagner Martin
Year of Publication
22.02.2018
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Method and Apparatus of Operating a Scanning Probe Microscope
by
Hu Yan
,
Su Chanmin
,
Hu Shuiqing
Year of Publication
24.08.2017
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Method and apparatus of operating a scanning probe microscope
by
Shi, Jian
,
Hu, Yan
,
Su
,
Chanmin
,
Hu, Shuiqing
,
Ma, Ji
Year of Publication
05.02.2019
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Method and Apparatus of Using Peak Force Tapping Mode to Measure Physical Properties of a Sample
by
Shi, Jian
,
Hu, Yan
,
Su
,
Chanmin
,
Hu, Shuiqing
,
Ma, Ji
Year of Publication
17.01.2019
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Method and apparatus of operating a scanning probe microscope
by
Hu Yan
,
Su Chanmin
,
Hu Shuiqing
Year of Publication
07.03.2017
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Sample vessel retention structure for scanning probe microscope
by
Meyer, Charles
,
Su
,
Chanmin
,
Hu, Shuiqing
,
Shaw, James
Year of Publication
08.01.2019
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Force Measurement with Real-Time Baseline Determination
by
Su
,
Chanmin
,
Pittenger, Bede
,
Liu, Changchun
,
Hu, Shuiging
Year of Publication
18.10.2018
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Non-destructive wafer-scale sub-surface ultrasonic microscopy employing near field AFM detection
by
Prater, Craig
,
Su
,
Chanmin
Year of Publication
04.12.2012
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Method and Apparatus of Operating a Scanning Probe Microscope
by
Hu Yan
,
Su Chanmin
,
Hu Shuiqing
Year of Publication
27.10.2016
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Method and apparatus of using peak force tapping mode to measure physical properties of a sample
by
Shi, Jian
,
Hu, Yan
,
Su
,
Chanmin
,
Hu, Shuiqing
,
Ma, Ji
Year of Publication
12.06.2018
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