Reliability aspects of gate oxide under ESD pulse stress
Ille, Adrien, Stadler, Wolfgang, Pompl, Thomas, Gossner, Harald, Brodbeck, Tilo, Esmark, Kai, Riess, Philipp, Alvarez, David, Chatty, Kiran, Gauthier, Robert, Bravaix, Alain
Published in Microelectronics and reliability (01.12.2009)
Published in Microelectronics and reliability (01.12.2009)
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Journal Article
Do ESD fails in systems correlate with IC ESD robustness?
Stadler, Wolfgang, Brodbeck, Tilo, Gärtner, Reinhold, Gossner, Harald
Published in Microelectronics and reliability (01.09.2009)
Published in Microelectronics and reliability (01.09.2009)
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Journal Article
Conference Proceeding
CDM tests on interface test chips for the verification of ESD protection concepts
Brodbeck, Tilo, Esmark, Kai, Stadler, Wolfgang
Published in Microelectronics and reliability (01.12.2009)
Published in Microelectronics and reliability (01.12.2009)
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Journal Article
ESD Characterization of Non-Powered Hand Tools
Hilkersberger, Magdalena, Gartner, Reinhold, Stadler, Wolfgang
Published in 2021 43rd Annual EOS/ESD Symposium (EOS/ESD) (26.09.2021)
Published in 2021 43rd Annual EOS/ESD Symposium (EOS/ESD) (26.09.2021)
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Conference Proceeding