Low Capture Power At-Speed Test with Local Hot Spot Analysis to Reduce Over-Test
Srivastava, Ankush, Abraham, Jais
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
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Conference Proceeding
Exploiting path delay test generation to develop better TDF tests for small delay defects
Srivastava, Ankush, Singh, Adit D., Singh, Virendra, Saluja, Kewal K.
Published in 2017 IEEE International Test Conference (ITC) (01.10.2017)
Published in 2017 IEEE International Test Conference (ITC) (01.10.2017)
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Conference Proceeding
A Reliability-Aware Methodology to Isolate Timing-Critical Paths under Aging
Srivastava, Ankush, Singh, Virendra, Singh, Adit D., Saluja, Kewal K.
Published in Journal of electronic testing (01.12.2017)
Published in Journal of electronic testing (01.12.2017)
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Journal Article
A Methodology for Identifying High Timing Variability Paths in Complex Designs
Srivastava, Ankush, Singh, Virendra, Singh, Adit D., Saluja, Kewal K.
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
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Conference Proceeding
Journal Article
A novel approach to improve test coverage of BSR cells
Srivastava, A, Prajapati, A, Soni, V
Published in 2010 IEEE International Test Conference (01.11.2010)
Published in 2010 IEEE International Test Conference (01.11.2010)
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Conference Proceeding
AUTOMATED NON-BILLING CYCLE REMITTANCE
KOHLI, Pankaj, CHOWDHARY, Yatharth, SRIVASTAVA, Ankush, SOSNICKI, Andrew, PENTAPATI, Surya B
Year of Publication 27.06.2024
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Year of Publication 27.06.2024
Patent
LOAD-BALANCING BATCH PROCESSING JOBS THROUGH AUTOMATED NON-BILLING CYCLE REMITTANCE
Chowdhary, Yatharth, Sosnicki, Andrew, Kohli, Pankaj, Pentapati, Surya B, Srivastava, Ankush
Year of Publication 27.07.2023
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Year of Publication 27.07.2023
Patent
LOAD-BALANCING BATCH PROCESSING JOBS THROUGH AUTOMATED NON-BILLING CYCLE REMITTANCE
Chowdhary, Yatharth, Sosnicki, Andrew, Kohli, Pankaj, Pentapati, Surya B, Srivastava, Ankush
Year of Publication 13.04.2023
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Year of Publication 13.04.2023
Patent
Identifying high variability speed-limiting paths under aging
Srivastava, Ankush, Singh, Virendra, Singh, Adit D., Saluja, Kewal K.
Published in 2017 18th IEEE Latin American Test Symposium (LATS) (01.03.2017)
Published in 2017 18th IEEE Latin American Test Symposium (LATS) (01.03.2017)
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Conference Proceeding
AUTOMATED NON-BILLING CYCLE REMITTANCE
KOHLI, Pankaj, CHOWDHARY, Yatharth, SRIVASTAVA, Ankush, SOSNICKI, Andrew, PENTAPATI, Surya B
Year of Publication 23.07.2020
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Year of Publication 23.07.2020
Patent
AUTOMATED NON-BILLING CYCLE REMITTANCE
PENTAPATI, SURYA B, CHOWDHARY, YATHARTH, SRIVASTAVA, ANKUSH, SOSNICKI, ANDREW, KOHLI, PANKAJ
Year of Publication 16.07.2020
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Year of Publication 16.07.2020
Patent