Flicker Noise Performance on Thick and Thin Oxide FinFETs
Yi Ming Ding, Misra, Durgamadhab, Srinivasan, Purushothaman
Published in IEEE transactions on electron devices (01.05.2017)
Published in IEEE transactions on electron devices (01.05.2017)
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Journal Article
RC-Effects on the Oxide of SOI MOSFET under Off-State TDDB Degradation: RF Characterization and Modeling
Otero-Carrascal, Alan, Chaparro-Ortiz, Dora, Srinivasan, Purushothaman, Huerta, Oscar, Gutiérrez-Domínguez, Edmundo, Torres-Torres, Reydezel
Published in Micromachines (Basel) (01.02.2024)
Published in Micromachines (Basel) (01.02.2024)
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Journal Article
A Physics-Based Analytical \hbox/f Noise Model for RESURF LDMOS Transistors
Mahmud, M. I., Celik-Butler, Z., Pinghai Hao, Srinivasan, P., Fan-Chi Hou, Xu Cheng, Amey, B. L., Pendharkar, S.
Published in IEEE transactions on electron devices (01.02.2013)
Published in IEEE transactions on electron devices (01.02.2013)
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Journal Article
Memory effects in 45-nm PDSOI MOSFETs at Cryogenic Temperatures for Quantum Computing Applications
Gupta, Sumreti, Sharma, Deepesh, Srinivasan, Purushothaman, Dixit, Abhisek
Published in 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (03.03.2024)
Published in 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (03.03.2024)
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Conference Proceeding
Investigation and Subcircuit Modeling of Self-Heating in PDSOI NFETs at Cryogenic Temperatures Using Pulsed I - V Technique for Co-Integrated Quantum Technologies
Gupta, Sumreti, Sharma, Deepesh, Amin, Asifa, Srinivasan, Purushothaman, Restrepo, Oscar D., Dixit, Abhisek
Published in IEEE transactions on electron devices (01.09.2024)
Published in IEEE transactions on electron devices (01.09.2024)
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Journal Article
Effective work-function control technique applicable to p-type FinFET high-k/metal gate devices
Yamaguchi, Shimpei, Bayindir, Zeynel, He, Xiaoli, Uppal, Suresh, Srinivasan, Purushothaman, Yong, Chloe, Choi, Dongil, Joshi, Manoj, Yang, Hyuck Soo, Hu, Owen, Samavedam, Srikanth, Sohn, D.K.
Published in Microelectronics and reliability (01.05.2017)
Published in Microelectronics and reliability (01.05.2017)
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Journal Article
Novel Oxide Top-Off Process Enabling Reliable PC-CA TDDB on IO Devices with Self Aligned Contact
Shen, Tian, Zainuddin, Abu Naser, Srinivasan, Purushothaman, Chbili, Zakariae, Zhao, Kai, Justison, Patrick
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Interaction of work function tuning and negative bias temperature instability for future nodes
Pantisano, Luigi, Srinivasan, Purushothaman, Kim, Taehoon, Chu, Tao, Ozbek, Merve, Zainuddin, Abu Naser, Hasanuzzaman, M., Dag, Sefa, Paliwoda, P., Bajaj, M., Kannan, Balaji, Kota, Murali, Zhao, Kai
Published in Microelectronic engineering (25.06.2017)
Published in Microelectronic engineering (25.06.2017)
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Journal Article
A Physics-Based Analytical 1/f Noise Model for RESURF LDMOS Transistors : ADVANCED MODELING OF POWER DEVICES AND THEIR APPLICATIONS
IQBAL MAHMUD, M, CELIK-BUTLER, Zeynep, PINGHAI HAO, SRINIVASAN, Purushothaman, HOU, Fan-Chi, XU CHENG, AMEY, Benjamin L, PENDHARKAR, Sameer
Published in IEEE transactions on electron devices (2013)
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Published in IEEE transactions on electron devices (2013)
Journal Article
Characterization and Analysis of Hot Carrier Degradation Under DC and Large-Signal RF Stress in a PDSOI Floating-Body NFET-Based Power Amplifier Cell Under WiFi Operating Conditions
Rathi, Aarti, Srinivasan, Purushothaman, Guarin, Fernando, Dixit, Abhisek
Published in IEEE transactions on device and materials reliability (01.06.2022)
Published in IEEE transactions on device and materials reliability (01.06.2022)
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Magazine Article