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Analysis of resistive defects on a foundry 8T SRAM-based IMC architecture
Ammoura, L., Flottes, M.-L., Girard, P., Noel, J.-P., Virazel, A.
Published in Microelectronics and reliability (01.08.2023)
Published in Microelectronics and reliability (01.08.2023)
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Improving the reliability of SRAM-based PUFs under varying operation conditions and aging degradation
Saraza-Canflanca, P., Carrasco-Lopez, H., Santana-Andreo, A., Brox, P., Castro-Lopez, R., Roca, E., Fernandez, F.V.
Published in Microelectronics and reliability (01.03.2021)
Published in Microelectronics and reliability (01.03.2021)
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Adaptive Proactive Reconfiguration: A Technique for Process-Variability- and Aging-Aware SRAM Cache Design
Pouyan, Peyman, Amat, Esteve, Rubio, Antonio
Published in IEEE transactions on very large scale integration (VLSI) systems (01.09.2015)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.09.2015)
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FMER: An Energy-Efficient Error Recovery Methodology for SRAM-Based FPGA Designs
Agiakatsikas, Dimitris, Cetin, Ediz, Diessel, Oliver
Published in IEEE transactions on aerospace and electronic systems (01.12.2018)
Published in IEEE transactions on aerospace and electronic systems (01.12.2018)
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A data remanence based approach to generate 100% stable keys from an SRAM physical unclonable function
Muqing Liu, Chen Zhou, Qianying Tang, Parhi, Keshab K., Kim, Chris H.
Published in 2017 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED) (01.07.2017)
Published in 2017 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED) (01.07.2017)
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Design of Low Power Memory Architecture using 10t Sram Array
Madhumalini, M., Saranraj, B.
Published in International journal of recent technology and engineering (30.11.2019)
Published in International journal of recent technology and engineering (30.11.2019)
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Evaluation of 90nm 6T-SRAM as Physical Unclonable Function for secure key generation in wireless sensor nodes
Selimis, Georgios, Konijnenburg, Mario, Ashouei, Maryam, Huisken, Jos, de Groot, Harmke, van der Leest, Vincent, Schrijen, Geert-Jan, van Hulst, Marten, Tuyls, Pim
Published in 2011 IEEE International Symposium of Circuits and Systems (ISCAS) (01.05.2011)
Published in 2011 IEEE International Symposium of Circuits and Systems (ISCAS) (01.05.2011)
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Fin shape fluctuations in FinFET: Correlation to electrical variability and impact on 6-T SRAM noise margins
Baravelli, Emanuele, De Marchi, Luca, Speciale, Nicolò
Published in Solid-state electronics (01.12.2009)
Published in Solid-state electronics (01.12.2009)
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8×8 SRAM Cell Array for Low-Power Applications
Rao, Satheesh, Bhat, Manoj, Anchan, Prajwal G, Shetty, Ninad, Rodrigues, Lisha Maria
Published in 2024 International Conference on Innovation and Novelty in Engineering and Technology (INNOVA) (20.12.2024)
Published in 2024 International Conference on Innovation and Novelty in Engineering and Technology (INNOVA) (20.12.2024)
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Chromosomal aberration frequency in lymphocytes predicts the risk of cancer: results from a pooled cohort study of 22 358 subjects in 11 countries
Bonassi, Stefano, Norppa, Hannu, Ceppi, Marcello, Strömberg, Ulf, Vermeulen, Roel, Znaor, Ariana, Cebulska-Wasilewska, Antonina, Fabianova, Eleonora, Fucic, Alexandra, Gundy, Sarolta, Hansteen, Inger-Lise, Knudsen, Lisbeth E., Lazutka, Juozas, Rossner, Pavel, Sram, Radim J., Boffetta, Paolo
Published in Carcinogenesis (New York) (01.06.2008)
Published in Carcinogenesis (New York) (01.06.2008)
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Estimation during Design Phases of Suitable SRAM Cells for PUF Applications Using Separatrix and Mismatch Metrics
Alheyasat, Abdel, Torrens, Gabriel, Bota, Sebastia A, Alorda, Bartomeu
Published in arXiv.org (02.12.2024)
Published in arXiv.org (02.12.2024)
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A High-Density 45 nm SRAM Using Small-Signal Non-Strobed Regenerative Sensing
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Design and Performance Analysis of 6T SRAM cell on 90nm technology
Zargar, Mehak, Goel, Anuj Kumar
Published in 2023 4th IEEE Global Conference for Advancement in Technology (GCAT) (06.10.2023)
Published in 2023 4th IEEE Global Conference for Advancement in Technology (GCAT) (06.10.2023)
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Analysis of NBTI-induced SNM degradation in power-gated SRAM cells
Calimera, A, Macii, E, Poncino, M
Published in 2010 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2010)
Published in 2010 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2010)
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