A submicrometer 252 GHz fT and 283 GHz fMAX inp DHBT with reduced CBC using selectively implanted buried subcollector (SIBS)
LI, James C, CHEN, Mary, HITKO, Donald A, FIELDS, Charles H, BINQIANG SHI, RAJAVEL, Rajesh, ASBECK, Peter M, SOKOLICH, Marko SR
Published in IEEE electron device letters (01.03.2005)
Published in IEEE electron device letters (01.03.2005)
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