METHOD FOR DETECTING AN INTERNAL SHORT CIRCUIT IN A BATTERY
BECKER, Jens, ZAFIRIDIS, Triantafyllos, COIS, Olivier, SOHNS, Joachim
Year of Publication 29.05.2024
Get full text
Year of Publication 29.05.2024
Patent
Method and device for testing a technical system
Glaser, Philipp, Yoon, Ji Su, Seiler-Thull, Daniel, Heinz, Thomas, Sohns, Joachim, Gladisch, Christoph
Year of Publication 28.02.2023
Get full text
Year of Publication 28.02.2023
Patent