Electrical characteristics of 20-nm junctionless Si nanowire transistors
Park, Chan-Hoon, Ko, Myung-Dong, Kim, Ki-Hyun, Baek, Rock-Hyun, Sohn, Chang-Woo, Baek, Chang Ki, Park, Sooyoung, Deen, M.J., Jeong, Yoon-Ha, Lee, Jeong-Soo
Published in Solid-state electronics (01.07.2012)
Published in Solid-state electronics (01.07.2012)
Get full text
Journal Article
World's First GAA 3nm Foundry platform Technology (SF3) with Novel Multi-Bridge-Channel-FET (MBCFET™) Process
Jeong, Jaehun, Lee, Sang Hyeon, Masuoka, Sada-Aki, Min, Shincheol, Lee, Sanghoon, Kim, Seungkwon, Myung, Taehun, Choi, Byungha, Sohn, Chang-Woo, Kim, Sung Won, Choi, Jeongmin, Park, Jungmin, Lee, Hyungjong, Kim, Taeyoung, Kim, Seokhoon, Yasuda-Masuoka, Yuri, Ku, Ja-Hum, Jeong, Gitae
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Get full text
Conference Proceeding
Analytic Model of S/D Series Resistance in Trigate FinFETs With Polygonal Epitaxy
Chang-Woo Sohn, Chang Yong Kang, Myung-Dong Ko, Do-Young Choi, Hyun Chul Sagong, Eui-Young Jeong, Chan-Hoon Park, Sang-Hyun Lee, Ye-Ram Kim, Chang-Ki Baek, Jeong-Soo Lee, Lee, J. C., Yoon-Ha Jeong
Published in IEEE transactions on electron devices (01.04.2013)
Published in IEEE transactions on electron devices (01.04.2013)
Get full text
Journal Article
Device Design Guidelines for Nanoscale FinFETs in RF/Analog Applications
Chang-Woo Sohn, Chang Yong Kang, Rock-Hyun Baek, Do-Young Choi, Hyun Chul Sagong, Eui-Young Jeong, Chang-Ki Baek, Jeong-Soo Lee, Lee, J. C., Yoon-Ha Jeong
Published in IEEE electron device letters (01.09.2012)
Published in IEEE electron device letters (01.09.2012)
Get full text
Journal Article
New Insight Into PBTI Evaluation Method for nMOSFETs With Stacked High- k/IL Gate Dielectric
Sang Kyung Lee, Minseok Jo, Chang-Woo Sohn, Chang Yong Kang, Lee, J. C., Yoon-Ha Jeong, Byoung Hun Lee
Published in IEEE electron device letters (01.11.2012)
Published in IEEE electron device letters (01.11.2012)
Get full text
Journal Article
Comprehensive Study of Quasi-Ballistic Transport in High- \kappa/Metal Gate nMOSFETs
Hyun Chul Sagong, Chang Yong Kang, Chang-Woo Sohn, Kanghoon Jeon, Eui-Young Jeong, Do-Young Choi, Chang-Ki Baek, Jeong-Soo Lee, Lee, J. C., Yoon-Ha Jeong
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
Get full text
Journal Article
Improved Degradation and Recovery Characteristics of SiGe p-Channel Metal--Oxide--Semiconductor Field-Effect Transistors under Negative-Bias Temperature Stress
Choi, Do-Young, Sohn, Chang-Woo, Sagong, Hyun Chul, Jung, Eui-Young, Kang, Chang Yong, Lee, Jeong-Soo, Jeong, Yoon-Ha
Published in Japanese Journal of Applied Physics (01.04.2013)
Published in Japanese Journal of Applied Physics (01.04.2013)
Get full text
Journal Article
Channel Geometry Impact and Narrow Sheet Effect of Stacked Nanosheet
Yeung, Chun Wing, Zhang, Jingyun, Chao, Robin, Kwon, Ohseong, Vega, Reinaldo, Tsutsui, Gen, Miao, Xin, Zhang, Chen, Sohn, Chang-Woo, Moon, Bum Ki, Razavieh, Ali, Frougier, Julien, Greene, Andrew, Galatage, Rohit, Li, Juntao, Wang, Miaomiao, Loubet, Nicolas, Robison, Robert, Basker, Veeraraghavan, Yamashita, Tenko, Guo, Dechao
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
Get full text
Conference Proceeding
Simple S/D Series Resistance Extraction Method Optimized for Nanowire FETs
Kim, Ye-Ram, Baek, Chang-Ki, Lee, Jeong-Soo, Jeong, Yoon-Ha, Lee, Sang-Hyun, Sohn, Chang-Woo, Choi, Do-Young, Sagong, Hyun-Chul, Kim, Sungho, Jeong, Eui-Young, Kim, Dong-Won, Hong, Hyeongsun
Published in IEEE electron device letters (01.07.2013)
Published in IEEE electron device letters (01.07.2013)
Get full text
Journal Article
Interfacial-Layer-Driven Dielectric Degradation and Breakdown of HfSiON/SiON Gate Dielectric nMOSFETs
CHOI, Do-Young, KYONG TAEK LEE, BAEK, Chang-Ki, CHANG WOO SOHN, HYUN CHUL SAGONG, JUNG, Eui-Young, LEE, Jeong-Soo, JEONG, Yoon-Ha
Published in IEEE electron device letters (01.10.2011)
Published in IEEE electron device letters (01.10.2011)
Get full text
Journal Article
Analysis of Abnormal Upturns in Capacitance-Voltage Characteristics for MOS Devices With High- k Dielectrics
Chang-Woo Sohn, Hyun Chul Sagong, Eui-Young Jeong, Do-Young Choi, Min Sang Park, Jeong-Soo Lee, Chang Yong Kang, Jammy, R, Yoon-Ha Jeong
Published in IEEE electron device letters (01.04.2011)
Published in IEEE electron device letters (01.04.2011)
Get full text
Journal Article