Target measurement uncertainties for results of chemical measurements in Slovenia
Majcen, Nineta, Skubic, Ivan, De Bièvre, Paul
Published in Accreditation and quality assurance (01.01.2004)
Published in Accreditation and quality assurance (01.01.2004)
Get full text
Journal Article
Internal and external characteristics in transient forward bias simulations of a-Si:H devices
Popovic, Pavle, Bassanese, Elvis, Furlan, Joze, Smole, Franc, Skubic, Ivan
Published in Journal of non-crystalline solids (01.11.1995)
Published in Journal of non-crystalline solids (01.11.1995)
Get full text
Journal Article