X-ray microanalysis with microcalorimeters
Isaila, C., Feilitzsch, F.v., Höhne, J., Hollerith, C., Phelan, K., Simmnacher, B., Weiland, R., Wernicke, D.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (15.04.2006)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (15.04.2006)
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Journal Article
Semiconductor material analysis based on microcalorimeter EDS
Simmnacher, B., Weiland, R., Höhne, J., Feilitzsch, F.v., Hollerith, C.
Published in Microelectronics and reliability (01.09.2003)
Published in Microelectronics and reliability (01.09.2003)
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Journal Article
Analytical tools for the characterization of power devices
SCHULZE, H.-J, FROHNMEYER, A, NIEDERNOSTHEIDE, F.-J, SIMMNACHER, B, KOLBESEN, B. O, TÜTTO, P, PAVELKA, T, WACHUTKA, G
Published in Journal of the Electrochemical Society (01.10.2000)
Published in Journal of the Electrochemical Society (01.10.2000)
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Journal Article
Analysis of the carrier and temperature distributions in gate turn-off thyristors by internal laser deflection
Simmnacher, B., Deboy, G., Ruff, M., Schulze, H.-J., Kolbesen, B.
Published in Proceedings of 9th International Symposium on Power Semiconductor Devices and IC's (1997)
Published in Proceedings of 9th International Symposium on Power Semiconductor Devices and IC's (1997)
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Conference Proceeding
Energy dispersive X-ray spectroscopy with microcalorimeters
Hollerith, C., Wernicke, D., Bühler, M., Feilitzsch, F.v., Huber, M., Höhne, J., Hertrich, T., Jochum, J., Phelan, K., Stark, M., Simmnacher, B., Weiland, W., Westphal, W.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (11.03.2004)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (11.03.2004)
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Journal Article
Exploring the limits of high temperature thermal processing for advanced 8-inch power technology manufacturing
Rupp, T., Dyroff, N., Gaertner, T., Gross, T., Gruber, H., Neidhart, T., Peri, H., Riss, J., Schagerl, G., Stefaner, A., Sorschag, K., Danzfuss, B., Domes, H., Gatterbauer, J., Geiger, H., Kaspar, J., Komposch, A., Leicht, M., Mayer, B., Muehlbacher, K.H., Pairitsch, H., Rogge, W., Simmnacher, B., Steinacher, S., Trieblnig, E., Wald, G., Weber, K., Wiebauer, W., Wiesinger, K., Henoeckl, A.
Published in 2004 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (IEEE Cat. No.04CH37530) (2004)
Published in 2004 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (IEEE Cat. No.04CH37530) (2004)
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Conference Proceeding
Cryogenic detector systems for materials analysis
Hoehne, J, Hess, U, Buehler, M, v Feilitzsch, F, Jochum, J, v Hentig, R, Hertrith, T, Hollerith, C, Huber, M, Nikolosi, J
Published in AIP Conference Proceedings (01.01.2002)
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Published in AIP Conference Proceedings (01.01.2002)
Conference Proceeding
Cryogenic detector systems for materials analysis
Hohne, J., Buhler, M., Feilitzsch, F.V., Jochum, J., Hertrich, T., Hollerith, C., Huber, M., Nicolosi, J., Phelan, K., Redfern, D., Simmnacher, B., Weiland, R., Wernicke, D.
Published in Proceedings of the 5th European Workshop on Low Temperature Electronics (2002)
Published in Proceedings of the 5th European Workshop on Low Temperature Electronics (2002)
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Conference Proceeding