A Novel Infrared and Visible Image Information Fusion Method Based on Phase Congruency and Image Entropy
Huang, Xinghua, Qi, Guanqiu, Wei, Hongyan, Chai, Yi, Sim, Jaesung
Published in Entropy (Basel, Switzerland) (01.12.2019)
Published in Entropy (Basel, Switzerland) (01.12.2019)
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Journal Article
Influence of Hole Current Crowding on Snapback Breakdown in Multi-Finger MOSFETs
Lee, Siyoun, Kim, Seong-Yeon, Oh, Haesoon, Sim, Jaesung, Choi, Woo Young
Published in IEEE access (2023)
Published in IEEE access (2023)
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Journal Article
A Novel Image Fusion Framework Based on Sparse Representation and Pulse Coupled Neural Network
Yin, Li, Zheng, Mingyao, Qi, Guanqiu, Zhu, Zhiqin, Jin, Fu, Sim, Jaesung
Published in IEEE access (2019)
Published in IEEE access (2019)
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Journal Article
Optimal Energetic-Trap Distribution of Nano-Scaled Charge Trap Nitride for Wider Vth Window in 3D NAND Flash Using a Machine-Learning Method
Nam, Kihoon, Park, Chanyang, Yoon, Jun-Sik, Yun, Hyeok, Jang, Hyundong, Cho, Kyeongrae, Kang, Ho-Jung, Park, Min-Sang, Sim, Jaesung, Choi, Hyun-Chul, Baek, Rock-Hyun
Published in Nanomaterials (Basel, Switzerland) (25.05.2022)
Published in Nanomaterials (Basel, Switzerland) (25.05.2022)
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Journal Article
Effects of Lateral Charge Spreading on the Reliability of TANOS (TaN/AlO/SiN/Oxide/Si) NAND Flash Memory
Changseok Kang, Jungdal Choi, Jaesung Sim, Changhyun Lee, Yoocheol Shin, Jintaek Park, Jongsun Sel, Sanghun Jeon, Youngwoo Park, Kinam Kim
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Conference Proceeding
Bi-Directional Long Short-Term Memory Neural Network Modeling of Data Retention Characterization in 3-D Triple-Level Cell NAND Flash Memory
Jang, Hyundong, Park, Chanyang, Nam, Kihoon, Yun, Hyeok, Cho, Kyeongrae, Yoon, Jun-Sik, Choi, Hyun-Chul, Kang, Ho-Jung, Park, Min Sang, Sim, Jaesung, Baek, Rock-Hyun
Published in IEEE transactions on electron devices (01.08.2022)
Published in IEEE transactions on electron devices (01.08.2022)
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Journal Article
Optimal Energetic-Trap Distribution of Nano-Scaled Charge Trap Nitride for Wider V th Window in 3D NAND Flash Using a Machine-Learning Method
Nam, Kihoon, Park, Chanyang, Yoon, Jun-Sik, Yun, Hyeok, Jang, Hyundong, Cho, Kyeongrae, Kang, Ho-Jung, Park, Min-Sang, Sim, Jaesung, Choi, Hyun-Chul, Baek, Rock-Hyun
Published in Nanomaterials (Basel, Switzerland) (25.05.2022)
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Published in Nanomaterials (Basel, Switzerland) (25.05.2022)
Journal Article
Blockchain based Consensus Checking in Cloud Storage
Qi, Guanqiu, Zhu, Zhiqin, Haner, Matthew, Sim, Jaesung, Sun, Jian, Chai, Yi, Chen, Yinong, Yongfu, Li
Published in 2019 IEEE 14th International Symposium on Autonomous Decentralized System (ISADS) (01.04.2019)
Published in 2019 IEEE 14th International Symposium on Autonomous Decentralized System (ISADS) (01.04.2019)
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Conference Proceeding
Printed Circuit Board and manufacturing method for the same
KIM SUN A, CHUN HEEJOON, KANG DEOK MAN, HWANG MI SUN, SIM JAESUNG, JUNG HYEWON, NA BYUNGDUK
Year of Publication 12.06.2020
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Year of Publication 12.06.2020
Patent
PRINTED CIRCUIT BOARD
KIM SUN A, CHUN HEEJOON, KANG DEOK MAN, HWANG MI SUN, SIM JAESUNG, NA BYUNGDUK, JUNG HYEWON
Year of Publication 21.05.2020
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Year of Publication 21.05.2020
Patent
A novel NAND-type MONOS memory using 63nm process technology for multi-gigabit flash EEPROMs
Yoocheol Shin, Jungdal Choi, Changseok Kang, Changhyun Lee, Ki-Tae Park, Jang-Sik Lee, Jongsun Sel, Kim, V., Byeongin Choi, Jaesung Sim, Dongchan Kim, Hag-ju Cho, Kinam Kim
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)
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Conference Proceeding
PRINTED CIRCUIT BOARD AND METHOD OF MANUFACTURING THE SAME
CHUN HEEJOON, KIM SUN A, KANG DEOK MAN, SIM JAESUNG, HWANG MI SUN, JUNG HYEWON, NA BYUNGDUK
Year of Publication 16.01.2020
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Year of Publication 16.01.2020
Patent
Printed Circuit Board and manufacturing method for the same
CHUN HEEJOON, KIM SUN A, KANG DEOK MAN, HWANG MI SUN, SIM JAESUNG, JUNG HYEWON, NA BYUNGDUK
Year of Publication 14.01.2020
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Year of Publication 14.01.2020
Patent
Accelerated Program Inhibition Failure by Trap-Mediated Tunneling in the Polycrystalline Floating-Channel 3-D NAND Flash Memory Array
Kim, Soomin, Lee, Unsang, Lee, Yeji, Ahn, Chiwook, Sim, Jaesung, Cho, Seongjae
Published in 2024 IEEE Silicon Nanoelectronics Workshop (SNW) (15.06.2024)
Published in 2024 IEEE Silicon Nanoelectronics Workshop (SNW) (15.06.2024)
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Conference Proceeding