Evaluation of Off-State Current Characteristics of Transistor Using Oxide Semiconductor Material, Indium--Gallium--Zinc Oxide
Kato, Kiyoshi, Shionoiri, Yutaka, Sekine, Yusuke, Furutani, Kazuma, Hatano, Takehisa, Aoki, Taro, Sasaki, Miyuki, Tomatsu, Hiroyuki, Koyama, Jun, Yamazaki, Sunpei
Published in Japanese Journal of Applied Physics (01.02.2012)
Published in Japanese Journal of Applied Physics (01.02.2012)
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Journal Article
(Invited) Success in Measurement the Lowest Off-state Current of Transistor in the World
Sekine, Yusuke, Furutani, Kazuma, Shionoiri, Yutaka, Kato, Kiyoshi, Koyama, Jun, Yamazaki, Shunpei
Published in ECS transactions (24.06.2011)
Published in ECS transactions (24.06.2011)
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Journal Article
Evaluation of Off-State Current Characteristics of Transistor Using Oxide Semiconductor Material, Indium–Gallium–Zinc Oxide
Kato, Kiyoshi, Shionoiri, Yutaka, Sekine, Yusuke, Furutani, Kazuma, Hatano, Takehisa, Aoki, Taro, Sasaki, Miyuki, Tomatsu, Hiroyuki, Koyama, Jun, Yamazaki, Sunpei
Published in Japanese Journal of Applied Physics (01.02.2012)
Published in Japanese Journal of Applied Physics (01.02.2012)
Get full text
Journal Article