by Shieh, Yeong-Ruey, Wu, Cheng-Wen
Published in IEEE design & test of computers (01.04.1998)

by Shieh, Yeong-Ruey, Wu, Cheng-Wen
Published in VLSI design (Yverdon, Switzerland) (01.01.1998)

by CHO SHIH-KENG, SHIEH YEONG-RUEY, HSU WEI-SHU, LIN CHI-HAN, LIU HSU-PIN, WANG YU-SHIANG
Year of Publication 17.01.2013

by Yeong-Ruey Shieh, Cheng- Wen Wu
Published in Proceedings of the Fourth Asian Test Symposium (1995)

by Yeong-Ruey Shieh, Cheng-Wen Wu
Published in Proceedings ETC 93 Third European Test Conference (1993)

by CHO SHIH-KENG, SHIEH YEONG-RUEY, HSU WEI-SHU, LIN CHI-HAN, LIU HSU-PIN, WANG YU-SHIANG
Year of Publication 16.01.2013

by SHIEH, YEONG-RUEY, WANG, YU-SHIANG, LIU, HSU-PIN, LIN, CHI-HAN, HSU, WEI-SHU, CHO, SHIH-KENG
Year of Publication 16.01.2013