Search Results - "SHICHI Hiroyasu" :: K.UTB vyhledávací portál

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ION BEAM DEVICE

by SHICHI HIROYASU, MATSUBARA SHINICHI, MUTO HIROYUKI, KAWANAMI YOSHIMI
Year of Publication 14.04.2016

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ION BEAM DEVICE AND ION BEAM IRRADIATION METHOD

by SHICHI HIROYASU, MATSUBARA SHINICHI, HASHIZUME TOMIHIRO, KAWANAMI YOSHIMI
Year of Publication 22.03.2016

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Patent

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ION GUN, ION MILLING DEVICE, AND ION MILLING METHOD

by SHICHI HIROYASU, TAKASU HISAYUKI, IWATANI TORU, ASAI KENGO
Year of Publication 07.03.2016

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ION GUN AND ION MILLING DEVICE, ION MILLING METHOD

by SHICHI HIROYASU, TAKASU HISAYUKI, IWATANI TORU, ASAI KENGO
Year of Publication 07.03.2016

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Patent

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ION-BEAM DEVICE AND ION-BEAM IRRADIATION METHOD

by SHICHI HIROYASU, MATSUBARA SHINICHI, HASHIZUME TOMIHIRO, KAWANAMI YOSHIMI
Year of Publication 11.02.2016

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ION MILLING DEVICE, ION SOURCE, AND ION MILLING METHOD

by SHICHI HIROYASU, TAKASU HISAYUKI, IWAYA TORU, ASAI KENGO
Year of Publication 04.02.2016

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ION-MILLING DEVICE AND ION-MILLING METHOD

by SHICHI HIROYASU, TAKASU HISAYUKI, IWAYA TORU, ASAI KENGO
Year of Publication 04.02.2016

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ION BEAM DEVICE

by SHICHI HIROYASU, ARAI NORIAKI, MATSUBARA SHINICHI, SAHO NORIHIDE, ISHITANI TORU
Year of Publication 26.11.2015

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ION BEAM DEVICE

by SHICHI HIROYASU, MATSUBARA SHINICHI, MUTO HIROYUKI, KAWANAMI YOSHIMI
Year of Publication 16.11.2015

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Patent

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ION BEAM PROCESSING OBSERVATION DEVICE AND ION BEAM PROCESSING OBSERVATION METHOD USING THE SAME

by ISHIGURO KOJI, SHICHI HIROYASU, TOMIMATSU SATOSHI, KANEOKA NORIYUKI, UMEMURA KAORU
Year of Publication 24.09.2015

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ION BEAM APPARATUS AND SAMPLE-ANALYZING METHOD

by SHICHI HIROYASU, ARAI NORIAKI, MATSUBARA SHINICHI, KAWANAMI YOSHIMI, OSE YOICHI, ISHITANI TORU
Year of Publication 20.07.2017

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Patent

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ION BEAM DEVICE AND EMITTER TIP ADJUSTMENT METHOD

by SHICHI HIROYASU, MUTO HIROYUKI, MATSUBARA SHINICHI, KAWANAMI YOSHIMI
Year of Publication 16.04.2015

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SAMPLE OBSERVATION METHOD

by ISHIGURO KOJI, SHICHI HIROYASU, TOMIMATSU SATOSHI, KANEOKA NORIYUKI, UMEMURA KAORU
Year of Publication 18.12.2014

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Patent

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CHARGED PARTICLE BEAM DEVICE

by SHICHI HIROYASU, MATSUBARA SHINICHI, KAWANAMI YOSHIMI, OSE YOICHI
Year of Publication 15.12.2014

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Patent

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ION SOURCE AND ION MILLING DEVICE

by MUTO HIROSHI, SHICHI HIROYASU, IWATANI TORU, ASAI KENGO, OSHIMA TAKU
Year of Publication 15.12.2014

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ION SOURCE AND ION MILLING APPARATUS

by ASAI, KENGO, SHICHI, HIROYASU, IWAYA, TORU, OHSHIMA, TAKASHI, MUTOU, HIROBUMI
Year of Publication 11.12.2014

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Patent

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Secondary ion yield changes in Si due to topography changes during Cs+ ion bombardment

by SHICHI, H, OHNISHI, K, NOMURA, S
Published in Japanese Journal of Applied Physics (01.05.1991)

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Journal Article

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ION BEAM DEVICE, INSPECTION DEVICE AND COMPOSITE DEVICE

by SHICHI HIROYASU, MATSUBARA SHINICHI, HASHIZUME TOMIHIRO, TOMIMATSU SATOSHI, OSHIMA TAKU, ISHITANI TORU
Year of Publication 13.10.2016

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Patent

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ION-BEAM DEVICE

by SHICHI HIROYASU, ARAI NORIAKI, MATSUBARA SHINICHI, KAWANAMI YOSHIMI, OSE YOICHI
Year of Publication 17.04.2014

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CHARGED PARTICLE MICROSCOPE

by SHICHI HIROYASU, MATSUBARA SHINICHI, KAWANAMI YOSHIMI, TANAKA HIROYUKI, OSE YOICHI
Year of Publication 31.10.2013

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Patent

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