Ion beam device and method for cleaning gas field ion source
SHICHI HIROYASU, MATSUBARA SHINICHI, KOBARU ATSUSHI, HASHIZUME TOMIHIRO, KAWANAMI YOSHIMI
Year of Publication 17.04.2018
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Year of Publication 17.04.2018
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lonenstrahlvorrichtung und Reinigungsverfahren für eine Gasfeldionenquelle
Hashizume, Tomihiro, Matsubara, Shinichi, Shichi, Hiroyasu, Kawanami, Yoshimi, Kobaru, Atsushi
Year of Publication 12.04.2018
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Year of Publication 12.04.2018
Patent
ION BEAM PROCESSING DEVICE AND PROCESSING METHOD
SHICHI HIROYASU, FUKUDA MUNEYUKI, TOMIMATSU SATOSHI, HASEGAWA MASAKI, NAKAYAMA YOSHINORI
Year of Publication 05.07.2012
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Year of Publication 05.07.2012
Patent
ION MICROSCOPE
ARAI NORIAKI, SHICHI HIROYASU, TANAKA HIROYUKI, SAHO NORIHIDE, OSE YOICHI
Year of Publication 26.04.2012
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Year of Publication 26.04.2012
Patent
ION BEAM DEVICE
SHICHI HIROYASU, ARAI NORIAKI, MATSUBARA SHINICHI, ISHITANI TOHRU, SAHO NORIHIDE
Year of Publication 03.11.2011
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Year of Publication 03.11.2011
Patent
ION Beam System and Machining Method
SHICHI HIROYASU, FUKUDA MUNEYUKI, TOMIMATSU SATOSHI, HASEGAWA MASAKI, NAKAYAMA YOSHINORI
Year of Publication 25.08.2011
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Year of Publication 25.08.2011
Patent
Method and apparatus for processing a micro sample
TOKUDA MITSUO, SHICHI HIROYASU, KASHIMA HIDEO, FUKUDA MUNEYUKI, TOMIMATSU SATOSHI, KOIKE HIDEMI, MITSUI YASUHIRO, UMEMURA KAORU
Year of Publication 31.12.2013
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Year of Publication 31.12.2013
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Apparatus and method for specimen fabrication
SHICHI HIROYASU, FUKUDA MUNEYUKI, TOMIMATSU SATOSHI, TAKAHASHI MIYUKI
Year of Publication 02.08.2011
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Year of Publication 02.08.2011
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Apparatus and method for specimen fabrication
Tomimatsu, Satoshi, Takahashi, Miyuki, Shichi, Hiroyasu, Fukuda, Muneyuki
Year of Publication 02.08.2011
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Year of Publication 02.08.2011
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SAMPLE PROCESSING APPARATUS
SHICHI HIROYASU, FUKUDA MUNEYUKI, KOIKE HIDEMI, SUGAYA MASAKAZU, UMEMURA KAORU
Year of Publication 07.07.2011
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Year of Publication 07.07.2011
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ION BEAM DEVICE
SHICHI HIROYASU, ARAI NORIAKI, MATSUBARA SHINICHI, YAMAOKA MASAHIRO, SAHO NORIHIDE
Year of Publication 23.06.2011
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Year of Publication 23.06.2011
Patent
Ion beam system and machining method
Shichi, Hiroyasu, Fukuda, Muneyuki, Nakayama, Yoshinori, Hasegawa, Masaki, Tomimatsu, Satoshi
Year of Publication 31.05.2011
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Year of Publication 31.05.2011
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Ion beam system and machining method
SHICHI HIROYASU, FUKUDA MUNEYUKI, TOMIMATSU SATOSHI, HASEGAWA MASAKI, NAKAYAMA YOSHINORI
Year of Publication 31.05.2011
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Year of Publication 31.05.2011
Patent
Gas field ion source, charged particle microscope, and apparatus
SHICHI HIROYASU, MATSUBARA SHINICHI, HASHIZUME TOMIHIRO, ISHITANI TOHRU, TOMIMATSU SATOSHI, OHSHIMA TAKASHI
Year of Publication 10.09.2013
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Year of Publication 10.09.2013
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lonenstrahlvorrichtung und lonenstrahlbestrahlungsverfahren
Matsubara, Shinichi, Hashizume, Tomihiro, Shichi, Hiroyasu, Kawanami, Yoshimi
Year of Publication 30.03.2017
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Year of Publication 30.03.2017
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Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same
ARAI NORIAKI, SHICHI HIROYASU, MATSUBARA SHINICHI, MUTO HIROYUKI, HASHIZUME TOMIHIRO, KAGA HIROYASU, KAWANAMI YOSHIMI, MORITANI HIRONORI, SAHO NORIHIDE, OSE YOICHI
Year of Publication 30.09.2014
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Year of Publication 30.09.2014
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