A new and simple probe-based method for preventing charging in focused-ion-beam micro-sampling
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Published in Microelectronic engineering (01.03.2005)
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Novel Scanning Ion Microscope with H3+ Gas Field Ionization Source
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Published in Microscopy and microanalysis (01.07.2016)
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ELECTRON BEAM APPLICATION DEVICE
KATANE Junichi, OSE Yoichi, OHSHIMA Takashi, SHICHI Hiroyasu, IDE Tatsuro, MORISHITA Hideo
Year of Publication 19.05.2022
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Year of Publication 19.05.2022
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FINE STRUCTURE MACHINING METHOD AND DEVICE
MINE TOSHIYUKI, SHICHI HIROYASU, WATANABE KEIJI, RYUZAKI DAISUKE, SAGAWA MISUZU
Year of Publication 14.03.2019
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Year of Publication 14.03.2019
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