Recessed channel field effect transistor (FET) device
Diaz, Carlos H, Sheu, Yi-Ming, Jang, Syun-Ming, Tao, Hun-Jan, Yang, Fu-Liang
Year of Publication 30.09.2008
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Year of Publication 30.09.2008
Patent
A scaleable model for STI mechanical stress effect on layout dependence of MOS electrical characteristics
Ke-Wei Su, Yi-Ming Sheu, Chung-Kai Lin, Sheng-Jier Yang, Wen-Jya Liang, Xuemei Xi, Chung-Shi Chiang, Jaw-Kang Her, Yu-Tai Chia, Diaz, C.H., Chenming Hu
Published in Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003 (2003)
Published in Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003 (2003)
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Conference Proceeding
Narrow width effect improvement with photoresist plug process and STI corner ion implantation
Sheu, Yi-Ming, Lin, Da-Wen, Chen, Cheng-Ku, Yeh, Po-Ying, Peng, Shi-Shung, Wu, Chung-Cheng
Year of Publication 15.07.2008
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Year of Publication 15.07.2008
Patent
Method for fabricating a recessed channel field effect transistor (FET) device
Diaz, Carlos H, Sheu, Yi-Ming, Jang, Syun-Ming, Tao, Hun-Jan, Yang, Fu-Liang
Year of Publication 13.12.2005
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Year of Publication 13.12.2005
Patent
Narrow width effect improvement with photoresist plug process and STI corner ion implantation
Sheu, Yi-Ming, Lin, Da-Wen, Chen, Cheng-Ku, Yeh, Po-Ying, Peng, Shi-Shung, Wu, Chung-Cheng
Year of Publication 04.07.2006
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Year of Publication 04.07.2006
Patent
A 65nm node strained SOI technology with slim spacer
Fu-Liang Yang, Chien-Chao Huang, Hou-Yu Chen, Jhon-Jhy Liaw, Tang-Xuan Chung, Hung-Wei Chen, Chang-Yun Chang, Cheng Chuan Huang, Kuang-Hsin Chen, Di-Hong Lee, Hsun-Chih Tsao, Cheng-Kuo Wen, Shui-Ming Cheng, Yi-Ming Sheu, Ke-Wei Su, Chi-Chun Chen, Tze-Liang Lee, Shih-Chang Chen, Chih-Jian Chen, Cheng-hung Chang, Jhi-cheng Lu, Weng Chang, Chuan-Ping Hou, Ying-Ho Chen, Kuei-Shun Chen, Ming Lu, Li-Wei Kung, Yu-Jun Chou, Fu-Jye Liang, Jan-Wen You, King-Chang Shu, Bin-Chang Chang, Jaw-Jung Shin, Chun-Kuang Chen, Tsai-Sheng Gau, Bor-Wen Chan, Yi-Chun Huang, Han-Jan Tao, Jyh-Huei Chen, Yung-Shun Chen, Yee-Chia Yeo, Fung, S.K.-H., Diaz, C.H., Wu, C.-M.M., Lin, B.J., Liang, M.-S., Sun, J.Y.-C., Chenming Hu
Published in IEEE International Electron Devices Meeting 2003 (2003)
Published in IEEE International Electron Devices Meeting 2003 (2003)
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Conference Proceeding