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Year of Publication 11.01.2024
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Year of Publication 16.08.2023
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진보된 인라인 부품 평균 테스트
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Year of Publication 20.09.2022
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Year of Publication 20.09.2022
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인라인 부품 평균 테스팅 및 잠재 신뢰성 결함 검출을 위한 방법들 및 시스템들
RATHERT ROBERT J, SHERMAN KARA L, SUTHERLAND DOUGLAS G, PRICE DAVID W, CAPPEL ROBERT
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Year of Publication 01.11.2019
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SYSTEMS AND METHODS FOR SEMICONDUCTOR ADAPTIVE TESTING USING INLINE DEFECT PART AVERAGE TESTING
LENOX, Chet, PRICE, David W, DONZELLA, Oreste, ROBINSON, John, SHERMAN, Kara, RATHERT, Robert J
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Year of Publication 06.12.2023
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System and method for identifying latent reliability defects in semiconductor devices
Cappel, Robert, Rathert, Robert J, Donzella, Oreste, Price, David W, Sherman, Kara L, Lenox, Chet V
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Year of Publication 12.09.2023
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SYSTEMS AND METHODS FOR SEMICONDUCTOR ADAPTIVE TESTING USING INLINE DEFECT PART AVERAGE TESTING
LENOX, Chet, PRICE, David W, DONZELLA, Oreste, ROBINSON, John, SHERMAN, Kara, RATHERT, Robert J
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Year of Publication 10.11.2022
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SYSTEM AND METHOD FOR IDENTIFYING LATENT RELIABILITY DEFECTS IN SEMICONDUCTOR DEVICES
PRICE, David W, DONZELLA, Oreste, LENOX, Chet V, CAPPEL, Robert, RATHERT, Robert J, SHERMAN, Kara L
Year of Publication 05.08.2021
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Year of Publication 05.08.2021
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SYSTEM AND METHOD FOR IDENTIFYING LATENT RELIABILITY DEFECTS IN SEMICONDUCTOR DEVICES
Cappel, Robert, Rathert, Robert J, Donzella, Oreste, Price, David W, Sherman, Kara L, Lenox, Chet V
Year of Publication 05.08.2021
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Year of Publication 05.08.2021
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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
LENOX, Chet, VON DEN HOFF, Mike, PRICE, David, W, DONZELLA, Oreste, ROBINSON, John, GROOS, Thomas, NARASIMHAN, Narayani, LIM, Teng, Song, LACH, Justin, SHERMAN, Kara, SAVILLE, Barry, RATHERT, Robert, J
Year of Publication 27.09.2023
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Year of Publication 27.09.2023
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Methods and systems for inline parts average testing and latent reliability defect detection
Cappel, Robert, Rathert, Robert J, Price, David W, Sutherland, Douglas G, Sherman, Kara L
Year of Publication 01.09.2020
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Year of Publication 01.09.2020
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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
LENOX, Chet, VON DEN HOFF, Mike, LIM, Teng, DONZELLA, Oreste, ROBINSON, John, RATHERT, Robert, GROOS, Thomas, NARASIMHAN, Narayani, PRICE, David, LACH, Justin, SHERMAN, Kara, SAVILLE, Barry
Year of Publication 23.06.2022
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Year of Publication 23.06.2022
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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
Robinson, John, Groos, Thomas, Lim, Teng Song, Rathert, Robert J, Donzella, Oreste, Lach, Justin, Price, David W, Sherman, Kara L, Lenox, Chet V, Narasimhan, Narayani, Von Den Hoff, Mike, Saville, Barry
Year of Publication 23.06.2022
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Year of Publication 23.06.2022
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Advanced in-line part average testing
Cappel, Robert, Groos, Thomas, Rathert, Robert J, Donzella, Oreste, Lim, Teng-Song, Price, David W, Hoff, Mike Von Den, Bhatti, Naema, Sutherland, Doug, Sherman, Kara L, Robinson, John Charles, Saville, Barry
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Year of Publication 05.04.2022
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Characterization of copper voids in damascene processes
Guldi, R.L., Shaw, J.B., Ritchison, J., Corum, D.L., Oestreich, S., Sherman, K., Lin, J.H., Fiordalice, R.
Published in IEEE transactions on semiconductor manufacturing (01.11.2004)
Published in IEEE transactions on semiconductor manufacturing (01.11.2004)
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Journal Article
Methods and Systems for Inline Parts Average Testing and Latent Reliability Defect Detection
Cappel, Robert, Rathert, Robert J, Price, David W, Sutherland, Douglas G, Sherman, Kara L
Year of Publication 27.09.2018
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Year of Publication 27.09.2018
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METHODS AND SYSTEMS FOR INLINE PARTS AVERAGE TESTING AND LATENT RELIABILITY DEFECT DETECTION
SUTHERLAND, Douglas G, PRICE, David W, CAPPEL, Robert, RATHERT, Robert J, SHERMAN, Kara L
Year of Publication 27.09.2018
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Year of Publication 27.09.2018
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