Search Results - "SHERMAN, BORIS" :: K.UTB vyhledávací portál

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IMAGE AUGMENTATION FOR MACHINE LEARNING BASED DEFECT EXAMINATION

by LEVANT BORIS, YEMINY TOMER, YACOBY RAN, SHERMAN BORIS, RESHEF BOTSER
Year of Publication 26.03.2024

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Patent

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DEFECT EXAMINATION ON A SEMICONDUCTOR SPECIMEN

by RIDELMAN YEHONATAN, COHEN BOAZ, OFIR YEHONATAN HAI, BADANES RAN, SHERMAN BORIS
Year of Publication 13.03.2024

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Patent

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METHOD AND SYSTEM FOR USE IN MEASUREING IN COMPREX PATTERNED STRUCTURES

by BRILL BOAZ, SHERMAN BORIS
Year of Publication 02.04.2014

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Patent

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MONITORING SYSTEM AND METHOD FOR VERIFYING MEASUREMENTS IN PATTERNED STRUCTURES

by BRILL BOAZ, TUROVETS IGOR, SHERMAN BORIS
Year of Publication 12.05.2014

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Patent

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Defect Detection Approaches Based on Simulated Reference Image

by Ofir, Nati, Shoshan, Yotam Ben, Badanes, Ran, Sherman, Boris
Year of Publication 21.03.2023

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Journal Article

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Method and system for use in measuring in complex patterned structures

by BOAZ BRILL, SHERMAN BORIS
Year of Publication 01.12.2021

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Patent

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Method and system for use in measuring in complex patterned structures

by BOAZ BRILL, SHERMAN BORIS
Year of Publication 01.12.2021

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Patent

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APPARATUS AND METHOD FOR DEFECT DETECTION INCLUDING PATCH-TO-PATCH COMPARISONS

by HADAD ZION, BULLKICH NOGA, DALLA TORRE MICHELE, SHERMAN BORIS, DANINO YEHUDA UDY
Year of Publication 23.12.2013

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Patent

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Method and system for use in measuring in complex patterned structures

by BOAZ BRILL, SHERMAN BORIS
Year of Publication 30.07.2020

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Patent

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IMAGE AUGMENTATION FOR MACHINE LEARNING BASED DEFECT EXAMINATION

by YEMINY, Tomer, SHERMAN, Boris, YACOBY, Ran, RESHEF, Botser, LEVANT, Boris
Year of Publication 21.03.2024

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Patent

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Monitoring system and method for verifying measurements in pattened structures

by Turovets, Igor, Sherman, Boris, Brill, Boaz
Year of Publication 26.05.2022

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Patent

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Defect Detection Approaches Based on Simulated Reference Image

by Ofir, Nati, Yotam Ben Shoshan, Badanes, Ran, Sherman, Boris
Published in arXiv.org (21.03.2023)

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Paper

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DEFECT EXAMINATION ON A SEMICONDUCTOR SPECIMEN

by RIDELMAN, Yehonatan, BADANES, Ran, SHERMAN, Boris, OFIR, Yehonatan Hai, COHEN, Boaz
Year of Publication 07.03.2024

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Patent

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Apparatus and methods for thickness and velocity measurement of flat moving materials using high frequency radar technologies

by Raykhman, Alexander M, Waldman, Ellis S, Sherman, Boris
Year of Publication 24.05.2022

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Patent

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MONITORING SYSTEM AND METHOD FOR VERIFYING MEASUREMENTS IN PATTENED STRUCTURES

by BRILL, BOAZ, SHERMAN, BORIS, TUROVETS, IGOR
Year of Publication 07.11.2019

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Patent

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METHOD FOR MEASURNG IN PATTERNED STRUCTURES

by BRILL, BOAZ, SHERMAN, BORIS
Year of Publication 25.11.2015

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Patent

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Monitoring system and method for verifying measurements in patterned structures

by Turovets, Igor, Sherman, Boris, Brill, Boaz
Year of Publication 21.05.2019

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Patent

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Optical measurement system

by BRILL, BOAZ, SHERMAN, BORIS, TUROVETS, IGOR
Year of Publication 11.12.2023

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Patent

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APPARATUS AND METHODS FOR THICKNESS AND VELOCITY MEASUREMENT OF FLAT MOVING MATERIALS USING HIGH FREQUENCY RADAR TECHNOLOGIES

by Waldman, Ellis S, Sherman, Boris, Ray kh man, Alexander M
Year of Publication 17.09.2020

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Patent

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APPARATUS AND METHODS FOR THICKNESS AND VELOCITY MEASUREMENT OF FLAT MOVING MATERIALS USING HIGH FREQUENCY RADAR TECHNOLOGIES

by SHERMAN, Boris, WALDMAN, Ellis, RAYKHMAN, Alexander
Year of Publication 27.09.2018

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Patent

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