Beyond Eliminating Timing Margin: An Efficient and Reliable Negative Margin Timing Error Detection for Neural Network Accelerator Without Accuracy Loss
Shen, Zhengguo, Shan, Weiwei, Du, Yuxuan, Li, Ziyu, Yang, Jun
Published in IEEE journal of solid-state circuits (01.05.2023)
Published in IEEE journal of solid-state circuits (01.05.2023)
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Journal Article
A 28nm All-Digital, 1.92-7.32mV/LSB, 0.5-2GS/s sample rate, 0-latency Voltage Sensor with Dynamic PVT Calibration for Wide-range Adaptive Voltage Scaling
Du, Yuxuan, Ge, Haitao, Chen, Zhuo, Zhou, Kaize, Shen, Zhengguo, Shan, Weiwei
Published in 2023 IEEE Custom Integrated Circuits Conference (CICC) (01.04.2023)
Published in 2023 IEEE Custom Integrated Circuits Conference (CICC) (01.04.2023)
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Conference Proceeding
An Adaptive Wide-Voltage-Range Droop Detection and Protection System Assisted with Timing Error Detection in 28nm CMOS
Deng, Lishuo, Shen, Zhengguo, Chen, Zhuo, Li, Cai, Qian, Junyi, Du, Yuxuan, Zhou, Kaize, Li, Keran, Li, Ruidong, Li, Tuo, Zou, Xiaofeng, Shan, Weiwei
Published in 2024 IEEE Custom Integrated Circuits Conference (CICC) (21.04.2024)
Published in 2024 IEEE Custom Integrated Circuits Conference (CICC) (21.04.2024)
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Conference Proceeding
Analysis of reference gene expression for real-time PCR based on relative quantitation and dual spike-in strategy in the silkworm Bombyx mori
Peng, Ran, Zhai, Yuanfen, Ding, Hua, Di, Tianyuan, Zhang, Ting, Li, Bing, Shen, Weide, Wei, Zhengguo
Published in Acta biochimica et biophysica Sinica (01.07.2012)
Published in Acta biochimica et biophysica Sinica (01.07.2012)
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Journal Article
TEPD: A Compound Timing Detection of Both Data-Transition and Path-Activation for Reliable In-Situ Timing Error Detection and Correction in 28nm CMOS
Shen, Zhengguo, Qian, Junyi, Li, Keran, Li, Ziyu, Deng, Lishuo, Shan, Weiwei
Published in 2023 IEEE Asian Solid-State Circuits Conference (A-SSCC) (05.11.2023)
Published in 2023 IEEE Asian Solid-State Circuits Conference (A-SSCC) (05.11.2023)
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Conference Proceeding
DSC-TRCP: Dynamically Self-calibrating Tunable Replica Critical Paths Timing Monitoring for Variation Resilient Circuits with Low Cost & Large Power/Frequency Gain
Shen, Zhengguo, Shan, Weiwei, Du, Yuxuan, Li, Ziyu, Wu, Chengjun, Yang, Jun
Published in 2022 IEEE Asian Solid-State Circuits Conference (A-SSCC) (06.11.2022)
Published in 2022 IEEE Asian Solid-State Circuits Conference (A-SSCC) (06.11.2022)
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Conference Proceeding