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"SHEMESHOR"
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X-ray based evaluation of a status of a structure of a substrate
by
SHEMESHOR
Year of Publication
16.03.2021
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VERFAHREN UND VORRICHTUNG ZUR AUSRICHTUNG EINER SÄULE FÜR STRAHLEN GELADENER TEILCHEN
by
SHEMESHOR
Year of Publication
15.10.2010
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Method and device for aligning a charged particle beam column
by
SHEMESHOR
Year of Publication
13.10.2010
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Method and device for aligning a charged particle beam column
by
SHEMESHOR
Year of Publication
19.04.2006
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METHOD AND DEVICE FOR ALIGNING A CHARGED PARTICLE BEAM COLUMN
by
SHEMESHOR
Year of Publication
20.01.2005
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METHODS AND SYSTEMS FOR PROCESS MONITORING USING X-RAY EMISSION
by
SHEMESHOR
Year of Publication
01.07.2004
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METHODS AND SYSTEMS FOR PROCESS MONITORING
by
SHEMESHOR
Year of Publication
22.04.2004
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METHODS AND SYSTEMS FOR PROCESS MONITORING USING X-RAY EMISSION
by
SHEMESHOR
Year of Publication
22.04.2004
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Method and device for aligning a charged particle beam column
by
SHEMESHOR
Year of Publication
02.05.2003
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METHOD AND DEVICE FOR ALIGNING A CHARGED PARTICLE BEAM COLUMN
by
SHEMESHOR
Year of Publication
17.04.2003
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Defect examination on a semiconductor specimen
by
BROOK, MIRIAM
,
SHEMESHOR
Year of Publication
16.05.2023
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Depth-profiling of samples based on X-ray measurements
by
GIRMONSKY, DORON
,
EILON, MICHAL
,
HADAR, URI
,
SHEMESHOR
Year of Publication
16.07.2024
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Non-destructive SEM-based depth-profiling of samples
by
GIRMONSKY, DORON
,
EILON, MICHAL
,
HADAR, URI
,
SHEMESHOR
Year of Publication
01.04.2024
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X-ray measurement-based depth profiling of sample
by
GIMONSKI, DORON
,
ALLEN MICHAEL
,
HADAR URI
,
SHEMESHOR
Year of Publication
01.03.2024
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Method for detecting voids and an inspection system
by
BREIL, NICOLAS L
,
KUCHIK, VADIM
,
SHEMESHOR
Year of Publication
21.09.2021
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Determination of defect location for examination of a specimen
by
GIRMONSKY, DORON
,
COHEN, BOAZ
,
BEN AMI, RAFAEL
,
SHEMESHOR
Year of Publication
16.01.2022
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SYSTEM UND VERFAHREN FÜR SCHNELLE ÄNDERUNGEN DER BRENNWEITE
by
SHEMESHOR
,
SHACHAL, DUBI
Year of Publication
15.08.2010
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SYSTEM AND METHOD FOR FAST FOCAL LENGTH ALTERATIONS
by
SHEMESHOR
,
SHACHAL, DUBI
Year of Publication
11.08.2010
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Process monitoring
by
SINGH, GURJEET
,
BULLOCK, EUGENE T
,
BOEHM, ADI
,
SHEMESHOR
Year of Publication
21.11.2021
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Method for detecting voids and an inspection system
by
BREIL, NICOLAS L
,
KUCHIK, VADIM
,
SHEMESHOR
Year of Publication
16.05.2019
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