A new approach to thermometer-to-binary encoder of flash ADCs- bubble error detection circuit
Bui Van Hieu, Seunghwan Choi, Jongkug Seon, Youngcheol Oh, Chongdae Park, Jaehyoun Park, Hyunwook Kim, Taikyeong Jeong
Published in 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) (01.08.2011)
Published in 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) (01.08.2011)
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