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Spline‐Based Drift Analysis for the Reliability of Semiconductor Devices
Hofer, Vera, Nowak, Thomas, Lewitschnig, Horst
Published in Advanced theory and simulations (01.08.2021)
Published in Advanced theory and simulations (01.08.2021)
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ELECTROMAGNETIC COMPATIBILITY OF SEMICONDUCTOR DEVICES EXPOSED TO TRANSITION RADIATION
Knyazev, Volodymyr, Serkov, Aleksandr, Breslavets, Vitaliy, Yakovenko, Igor
Published in Сучасні інформаційні системи (08.07.2019)
Published in Сучасні інформаційні системи (08.07.2019)
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Intelligent Reflecting Surface: Practical Phase Shift Model and Beamforming Optimization
Abeywickrama, Samith, Zhang, Rui, Wu, Qingqing, Yuen, Chau
Published in IEEE transactions on communications (01.09.2020)
Published in IEEE transactions on communications (01.09.2020)
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Health State Estimation and Remaining Useful Life Prediction of Power Devices Subject to Noisy and Aperiodic Condition Monitoring
Zhao, Shuai, Peng, Yingzhou, Yang, Fei, Ugur, Enes, Akin, Bilal, Wang, Huai
Published in IEEE transactions on instrumentation and measurement (2021)
Published in IEEE transactions on instrumentation and measurement (2021)
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A Noble Metal Dichalcogenide for High‐Performance Field‐Effect Transistors and Broadband Photodetectors
Wang, Zhen, Wang, Peng, Wang, Fang, Ye, Jiafu, He, Ting, Wu, Feng, Peng, Meng, Wu, Peisong, Chen, Yunfeng, Zhong, Fang, Xie, Runzhang, Cui, Zhuangzhuang, Shen, Liang, Zhang, Qinghua, Gu, Lin, Luo, Man, Wang, Yang, Chen, Huawei, Zhou, Peng, Pan, Anlian, Zhou, Xiaohao, Zhang, Lili, Hu, Weida
Published in Advanced functional materials (01.01.2020)
Published in Advanced functional materials (01.01.2020)
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Soft magnetic materials for a sustainable and electrified world
Silveyra, Josefina M., Ferrara, Enzo, Huber, Dale L., Monson, Todd C.
Published in Science (American Association for the Advancement of Science) (26.10.2018)
Published in Science (American Association for the Advancement of Science) (26.10.2018)
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