Demonstration, analysis, and device design considerations for independent DG MOSFETs
Masahara, M., Yongxun Liu, Sakamoto, K., Endo, K., Matsukawa, T., Ishii, K., Sekigawa, T., Yamauchi, H., Tanoue, H., Kanemaru, S., Koike, H., Suzuki, E.
Published in IEEE transactions on electron devices (01.09.2005)
Published in IEEE transactions on electron devices (01.09.2005)
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Journal Article
Gene-expression profiles in human nasal polyp tissues and identification of genetic susceptibility in aspirin-intolerant asthma
Sekigawa, T., Tajima, A., Hasegawa, T., Hasegawa, Y., Inoue, H., Sano, Y., Matsune, S., Kurono, Y., Inoue, I.
Published in Clinical and experimental allergy (01.07.2009)
Published in Clinical and experimental allergy (01.07.2009)
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Journal Article
Investigation of the TiN Gate Electrode With Tunable Work Function and Its Application for FinFET Fabrication
Yongxun Liu, Kijima, S., Sugimata, E., Masahara, M., Endo, K., Matsukawa, T., Ishii, K., Sakamoto, K., Sekigawa, T., Yamauchi, H., Takanashi, Y., Suzuki, E.
Published in IEEE transactions on nanotechnology (01.11.2006)
Published in IEEE transactions on nanotechnology (01.11.2006)
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Journal Article
A highly threshold Voltage-controllable 4T FinFET with an 8.5-nm-thick Si-fin channel
Yongxun Liu, Masahara, M., Ishii, K., Sekigawa, T., Takashima, H., Yamauchi, H., Suzuki, E.
Published in IEEE electron device letters (01.07.2004)
Published in IEEE electron device letters (01.07.2004)
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Journal Article
Ultrathin channel vertical DG MOSFET fabricated by using ion-bombardment-retarded etching
Masahara, M., Yongxun Liu, Hosokawa, S., Matsukawa, T., Ishii, K., Tanoue, H., Sakamoto, K., Sekigawa, T., Yamauchi, H., Kanemaru, S., Suzuki, E.
Published in IEEE transactions on electron devices (01.12.2004)
Published in IEEE transactions on electron devices (01.12.2004)
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Journal Article
Highly suppressed short-channel effects in ultrathin SOI n-MOSFETs
Suzuki, E., Ishii, K., Kanemaru, S., Maeda, T., Tsutsumi, T., Sekigawa, T., Nagai, K., Hiroshima, H.
Published in IEEE transactions on electron devices (01.02.2000)
Published in IEEE transactions on electron devices (01.02.2000)
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Journal Article
Metal-Gate FinFET Variation Analysis by Measurement and Compact Model
O'uchi, S.-i., Matsukawa, T., Nakagawa, T., Endo, K., Yongxun Liu, Sekigawa, T., Tsukada, J., Ishikawa, Y., Yamauchi, H., Ishii, K., Suzuki, E., Koike, H., Sakamoto, K., Masahara, M.
Published in IEEE electron device letters (01.05.2009)
Published in IEEE electron device letters (01.05.2009)
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Journal Article
A Dynamical Power-Management Demonstration Using Four-Terminal Separated-Gate FinFETs
Endo, K., Ishikawa, Y., Liu, Y.X., Matsukawa, T., O'uchi, S., Ishii, K., Masahara, M., Tsukada, J., Yamauchi, H., Sekigawa, T., Koike, H., Suzuki, E.
Published in IEEE electron device letters (01.05.2007)
Published in IEEE electron device letters (01.05.2007)
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Journal Article
Systematic electrical characteristics of ideal rectangular cross section Si-Fin channel double-gate MOSFETs fabricated by a wet process
Yongxun Liu, Ishii, K., Tsutsumi, T., Masahara, M., Sekigawa, T., Sakamoto, K., Takashima, H., Yamauchi, H., Suzuki, E.
Published in IEEE transactions on nanotechnology (01.12.2003)
Published in IEEE transactions on nanotechnology (01.12.2003)
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Journal Article
Conference Proceeding
High-frequency characterization of intrinsic FinFET channel
Sakai, H, O'uchi, S, Matsukawa, T, Endo, K, Liu, Y X, Tsukada, T, Ishikawa, Y, Nakagawa, T, Sekigawa, T, Koike, H, Sakamoto, K, Masahara, M, Ishikuro, H
Published in 2010 IEEE International SOI Conference (SOI) (01.10.2010)
Published in 2010 IEEE International SOI Conference (SOI) (01.10.2010)
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Conference Proceeding
0.5V FinFET SRAM with dynamic threshold control of pass gates for salvaging malfunctioned bits
O'uchi, S, Endo, K, Liu, Y X, Nakagawa, T, Matsukawa, T, Ishikawa, Y, Tsukada, J, Yamauchi, H, Sekigawa, T, Koike, H, Sakamoto, K, Masahara, M
Published in 2010 Proceedings of ESSCIRC (01.09.2010)
Published in 2010 Proceedings of ESSCIRC (01.09.2010)
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Conference Proceeding
Realization of 0.7-V analog circuits by adaptive-Vt operation of FinFET
O'uchi, S, Endo, K, Liu, Y X, Nakagawa, T, Matsukawa, T, Ishikawa, Y, Tsukada, J, Sekigawa, T, Koike, H, Sakamoto, K, Masahara, M
Published in IEEE Custom Integrated Circuits Conference 2010 (01.09.2010)
Published in IEEE Custom Integrated Circuits Conference 2010 (01.09.2010)
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Conference Proceeding
An interface circuit for a Josephson-CMOS hybrid digital system
Suzuki, M., Maezawa, M., Takato, H., Nakagawa, H., Hirayama, F., Kiryu, S., Aoyagi, M., Sekigawa, T., Shoji, A.
Published in IEEE transactions on applied superconductivity (01.06.1999)
Published in IEEE transactions on applied superconductivity (01.06.1999)
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Journal Article
Conference Proceeding
Age and growth of Sebastes vulpes in the coastal waters of western Hokkaido, Japan
Sekigawa, T. (Hokkaido Univ., Sapporo (Japan)), Takahashi, T, Takatsu, T, Nishiuchi, S, Sasaki, M, Shiokawa, F
Published in Fisheries science (01.06.2003)
Published in Fisheries science (01.06.2003)
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Journal Article
4-terminal FinFETs with high threshold voltage controllability
Liu, Y.X., Masahara, A., Ishii, K., Sekigawa, T., Takashirna, H., Yarnauchi, H., Tsutsurni, T., Sakamoto, K., Suzuki, E.
Published in Conference Digest [Includes 'Late News Papers' volume] Device Research Conference, 2004. 62nd DRC (2004)
Published in Conference Digest [Includes 'Late News Papers' volume] Device Research Conference, 2004. 62nd DRC (2004)
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Conference Proceeding
Advanced FinFET technology: TiN metal-gate CMOS and 3T/4T device integration
Liu, Y.X., Endo, K., Masahara, M., Sugimata, E., Matsukawa, T., Ishii, K., Yamauchi, H., Shimizu, T., Sakamoto, K., O'uchi, S., Sekigawa, T., Suzuki, E.
Published in 2005 IEEE International SOI Conference Proceedings (2005)
Published in 2005 IEEE International SOI Conference Proceedings (2005)
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Conference Proceeding
Sequence analysis of three plasmids harboured in Rhodococcus erythropolis strain PR4
Sekine, Mitsuo, Tanikawa, Satoshi, Omata, Seiha, Saito, Mika, Fujisawa, Takatomo, Tsukatani, Naofumi, Tajima, Takahisa, Sekigawa, Tomohiro, Kosugi, Hiroki, Matsuo, Yasunori, Nishiko, Rika, Imamura, Kohsuke, Ito, Mio, Narita, Hitomi, Tago, Shinichi, Fujita, Nobuyuki, Harayama, Shigeaki
Published in Environmental microbiology (01.02.2006)
Published in Environmental microbiology (01.02.2006)
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