Static-noise margin analysis of MOS SRAM cells
Seevinck, E., List, F.J., Lohstroh, J.
Published in IEEE journal of solid-state circuits (01.10.1987)
Published in IEEE journal of solid-state circuits (01.10.1987)
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Journal Article
High speed current-mode signaling circuits for on-chip interconnects
Katoch, A., Veendrick, H., Seevinck, E.
Published in 2005 IEEE International Symposium on Circuits and Systems (ISCAS) (2005)
Published in 2005 IEEE International Symposium on Circuits and Systems (ISCAS) (2005)
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Conference Proceeding
An SRAM array based on a four-transistor CMOS SRAM cell
De Beer, S., du Plessis, M., Seevinck, E.
Published in IEEE transactions on circuits and systems. 1, Fundamental theory and applications (01.09.2003)
Published in IEEE transactions on circuits and systems. 1, Fundamental theory and applications (01.09.2003)
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Journal Article
Worst-case static noise margin criteria for logic circuits and their mathematical equivalence
Lohstroh, J., Seevinck, E., de Groot, J.
Published in IEEE journal of solid-state circuits (01.12.1983)
Published in IEEE journal of solid-state circuits (01.12.1983)
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Journal Article