Showing
1 - 17
results of
17
for search '
"SCHNARCH, Baruch"
'
Skip to content
Portal K.UTB
Čeština
Login
TBU Catalog
e-resources
E-THESES
All Fields
Title
Author
Subject
Find
Advanced Search
Search Results - "SCHNARCH, Baruch"
Showing
1 - 17
results of
17
for search '
"SCHNARCH, Baruch"
'
, query time: 0.78s
Refine Results
Sort
Relevance
Date Descending
Date Ascending
1
Loading…
Phase lock loop bypass for board-level testing of systems
by
Pappu, Lakshminarayana
,
Schnarch
,
Baruch
Year of Publication
28.05.2019
Get full text
Patent
Save to List
Saved in:
2
Loading…
PHASE LOCK LOOP BYPASS FOR BOARD-LEVEL TESTING OF SYSTEMS
by
PAPPU, Lakshminarayana
,
SCHNARCH
,
Baruch
Year of Publication
27.09.2018
Get full text
Patent
Save to List
Saved in:
3
Loading…
Stacked semiconductor package and method for performing bare die testing on a functional die in a stacked semiconductor package
by
Pappu, Lakshminarayana
,
Schnarch
,
Baruch
Year of Publication
12.06.2018
Get full text
Patent
Save to List
Saved in:
4
Loading…
SYSTEMS, METHODS, AND APPARATUSES FOR IMPLEMENTING TESTING OF FAULT REPAIRS TO A THROUGH SILICON VIA (TSV) IN TWO-LEVEL MEMORY (2LM) STACKED DIE SUBSYSTEMS
by
PAPPU LAKSHMINARAYANA
,
SCHNARCH BARUCH
Year of Publication
05.04.2018
Get full text
Patent
Save to List
Saved in:
5
Loading…
Firmware fingerprinting based on data monitored during firmware loading
by
Pappu, Lakshminarayana
,
Schnarch
,
Baruch
,
Doshi, Hem Vasant
Year of Publication
01.10.2019
Get full text
Patent
Save to List
Saved in:
6
Loading…
FIRMWARE LOADER FOR ELECTRONIC DEVICES
by
Pappu, Lakshminarayana
,
Schnarch
,
Baruch
,
Doshi, Hem Vasant
Year of Publication
28.06.2018
Get full text
Patent
Save to List
Saved in:
7
Loading…
FIRMWARE FINGERPRINTING
by
Pappu, Lakshminarayana
,
Schnarch
,
Baruch
,
Doshi, Hem Vasant
Year of Publication
28.06.2018
Get full text
Patent
Save to List
Saved in:
8
Loading…
Stacked semiconductor package having fault detection and a method for identifying a fault in a stacked package
by
Nelson, Christopher J
,
Pappu, Lakshminarayana
,
Goldin Schwabova, Danka
,
Schnarch
,
Baruch
Year of Publication
15.05.2018
Get full text
Patent
Save to List
Saved in:
9
Loading…
Drive only at speed functional testing; one of the techniques Intel is using to control test costs
by
Tripp, M.
,
Picano, S.
,
Schnarch, B.
Published in
IEEE International Conference on Test, 2005
(2005)
Get full text
Conference Proceeding
Save to List
Saved in:
10
Loading…
A STACKED SEMICONDUCTOR PACKAGE HAVING FAULT DETECTION AND A METHOD FOR IDENTIFYING A FAULT IN A STACKED PACKAGE
by
NELSON CHRISTOPHER J
,
GOLDIN SCHWABOVA DANKA
,
PAPPU LAKSHMINARAYANA
,
SCHNARCH BARUCH
Year of Publication
05.04.2018
Get full text
Patent
Save to List
Saved in:
11
Loading…
Testing unit and self-evaluating device
by
SCHNARCH BARUCH
Year of Publication
30.08.2005
Get full text
Patent
Save to List
Saved in:
12
Loading…
Testing unit and self-evaluating device
by
Schnarch
,
Baruch
Year of Publication
30.08.2005
Get full text
Patent
Save to List
Saved in:
13
Loading…
Testing unit and self-evaluating device
by
Schnarch
,
Baruch
Year of Publication
23.10.2003
Get full text
Patent
Save to List
Saved in:
14
Loading…
Testing unit and self-evaluating device
by
SCHNARCH BARUCH
Year of Publication
23.10.2003
Get full text
Patent
Save to List
Saved in:
15
Loading…
Testing unit and self-evaluating device
by
SCHNARCH BARUCH
Year of Publication
08.07.2003
Get full text
Patent
Save to List
Saved in:
16
Loading…
Testing unit and self-evaluating device
by
Schnarch
,
Baruch
Year of Publication
08.07.2003
Get full text
Patent
Save to List
Saved in:
17
Loading…
SYSTEMS, METHODS, AND APPARATUSES FOR IMPLEMENTING A VIRTUAL DEVICE OBSERVATION AND DEBUG NETWORK FOR HIGH SPEED SERIAL IOS
by
DOSHI HEM
,
PAPPU LAKSHMINARAYANA
,
SCHNARCH BARUCH
,
CALLAHAN TIMOTHY J
,
BHATT SUKETU U
Year of Publication
04.01.2018
Get full text
Patent
Save to List
Saved in:
RSS Feed
Email Search
Save Search
Search History
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit to articles from scholarly journals
Limit to articles with full text available
Limit to Open Access content
Exclude newspaper articles
Include articles at other libraries
Expand results using synonyms
Format
Patent
16 results
16
Conference Proceeding
1 results
1
Subject Area
chemistry
13 results
13
medicine
13 results
13
physics
13 results
13
sciences
13 results
13
engineering
1 results
1
Topic
physics
13 results
13
calculating
9 results
9
computing
9 results
9
counting
9 results
9
electric digital data processing
9 results
9
electricity
7 results
7
See more
Language
English
17 results
17
Year of Publication
From:
To:
Database
esp@cenet
13 results
13
USPTO Issued Patents
2 results
2
USPTO Published Applications
1 results
1
IEEE Electronic Library Online
1 results
1
