The impact of nitrogen on the defect aggregation in silicon
von Ammon, W., Hölzl, R., Virbulis, J., Dornberger, E., Schmolke, R., Gräf, D.
Published in Journal of crystal growth (01.06.2001)
Published in Journal of crystal growth (01.06.2001)
Get full text
Journal Article
On the impact of nanotopography of silicon wafers on post-chemical mechanical polished oxide layers
SCHMOLKE, R, DETERS, R, THIEME, P, PECH, R, SCHWENK, H, DIAKOURAKIS, G
Published in Journal of the Electrochemical Society (01.04.2002)
Published in Journal of the Electrochemical Society (01.04.2002)
Get full text
Journal Article
A comprehensive Eulerian modelling framework for airborne mercury species: model development and applications in Europe
Petersen, G., Bloxam, R., Wong, S., Munthe, J., Krüger, O., Schmolke, S.R., Kumar, A.Vinod
Published in Atmospheric environment (1994) (01.06.2001)
Published in Atmospheric environment (1994) (01.06.2001)
Get full text
Journal Article
Conference Proceeding
Simultaneous measurements of total gaseous mercury at four sites on a 800 km transect: spatial distribution and short-time variability of total gaseous mercury over central Europe
Schmolke, S.R., Schroeder, W.H., Kock, H.H., Schneeberger, D., Munthe, J., Ebinghaus, R.
Published in Atmospheric environment (1994) (01.05.1999)
Published in Atmospheric environment (1994) (01.05.1999)
Get full text
Journal Article
Photoelastic stress evaluation and defect monitoring in 300-mm-wafer manufacturing
Geiler, H.D, Wagner, M, Karge, H, Paulsen, M, Schmolke, R
Published in Materials science in semiconductor processing (01.08.2002)
Published in Materials science in semiconductor processing (01.08.2002)
Get full text
Journal Article
Erratum to “The impact of nitrogen on the defect aggregation in silicon”: [J. Crystal Growth 226 (2001) 19–30]
von Ammon, W., Hölzl, R., Virbulis, J., Dornberger, E., Schmolke, R., Gräf, D.
Published in Journal of crystal growth (01.04.2002)
Published in Journal of crystal growth (01.04.2002)
Get full text
Journal Article
Techniques for analysing nanotopography on polished silicon wafers
Müller, T., Kumpe, R., Gerber, H.A., Schmolke, R., Passek, F., Wagner, P.
Published in Microelectronic engineering (01.05.2001)
Published in Microelectronic engineering (01.05.2001)
Get full text
Journal Article
Conference Proceeding
On the impact of nanotopography of silicon wafers on post-CMP oxide layers
Schmolke, R, Deters, R, Thieme, P, Pech, R, Schwenk, H, Diakourakis, G
Published in Materials science in semiconductor processing (01.08.2002)
Published in Materials science in semiconductor processing (01.08.2002)
Get full text
Journal Article
Discrimination of particles and defects on silicon wafers
Passek, F, Schmolke, R, Piontek, H, Luger, A, Wagner, P
Published in Microelectronic engineering (01.07.1999)
Published in Microelectronic engineering (01.07.1999)
Get full text
Journal Article
A model for impurity-related optical bistability in II–VI semiconductors
Get full text
Journal Article
Conference Proceeding
Nonlinear optical switching fronts in CdS
Schmolke, R., Schöll, E., Nägele, M., Gutowski, J.
Published in Journal of crystal growth (01.04.1994)
Published in Journal of crystal growth (01.04.1994)
Get full text
Journal Article
Conference Proceeding
Multivariate statistical approach to the temporal and spatial patterns of selected bioindicators observed in the North Sea during the years 1995–1997
Schmolke, S. R, Broeg, K, Zander, S, Bissinger, V, Hansen, P. D, Kress, N, Herut, B, Jantzen, E, Krüner, G, Sturm, A, Körting, W, von Westernhagen, H
Published in Helgoland marine research (01.01.1999)
Published in Helgoland marine research (01.01.1999)
Get full text
Journal Article
Piezo and pyroelectricity and structure of doped polymers
Danz, R., Elling, B., Kunstler, W., Pinnow, M., Schmolke, R., Wedel, A., Geiss, D.
Published in IEEE transactions on electrical insulation (01.04.1990)
Published in IEEE transactions on electrical insulation (01.04.1990)
Get full text
Journal Article
High resolution structure imaging of octahedral void defects in as-grown Czochralski silicon
BENDER, G, VANHELLEMONT, J, SCHMOLKE, R
Published in Japanese Journal of Applied Physics (15.09.1997)
Published in Japanese Journal of Applied Physics (15.09.1997)
Get full text
Journal Article
Morphology Change of Artificial Crystal Originated Particles, and the Effect on Gate Oxide Integrity
Twan Bearda, Twan Bearda, Paul W. Mertens, Paul W. Mertens, Marc M. Heyns, Marc M. Heyns, Rüdiger Schmolke, Rüdiger Schmolke
Published in Japanese Journal of Applied Physics (01.01.2000)
Published in Japanese Journal of Applied Physics (01.01.2000)
Get full text
Journal Article