Beryllium-Based Multilayer Mirrors and Filters for the Extreme Ultraviolet Range
Nikolay, Chkhalo, Alexey, Lopatin, Andrey, Nechay, Dmitriy, Pariev, Alexey, Pestov, Vladimir, Polkovnikov, Nikolay, Salashchenko, Franz, Schäfers, Mewael, Sertsu, Andrey, Sokolov, Mikhail, Svechnikov, Nikolay, Tsybin, Sergey, Zuev
Published in Journal of nanoscience and nanotechnology (01.01.2019)
Published in Journal of nanoscience and nanotechnology (01.01.2019)
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Journal Article
Soft X‐ray varied‐line‐spacing gratings fabricated by near‐field holography using an electron beam lithography‐written phase mask
Lin, Dakui, Liu, Zhengkun, Dietrich, Kay, Sokolov, Andréy, Sertsu, Mewael Giday, Zhou, Hongjun, Huo, Tonglin, Kroker, Stefanie, Chen, Huoyao, Qiu, Keqiang, Xu, Xiangdong, Schäfers, Franz, Liu, Ying, Kley, Ernst-Bernhard, Hong, Yilin
Published in Journal of synchrotron radiation (01.09.2019)
Published in Journal of synchrotron radiation (01.09.2019)
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Journal Article
Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2(Ti)/SiO2/Si stacks
Filatova, Elena O, Kozhevnikov, Igor V, Sokolov, Andrey A, Ubyivovk, Evgeniy V, Yulin, Sergey, Gorgoi, Mihaela, Schäfers, Franz
Published in Science and technology of advanced materials (01.02.2012)
Published in Science and technology of advanced materials (01.02.2012)
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Journal Article
Interface engineering of short-period Ni/V multilayer X-ray mirrors
Eriksson, Fredrik, Ghafoor, Naureen, Schäfers, Franz, Gullikson, Eric M., Birch, Jens
Published in Thin solid films (03.04.2006)
Published in Thin solid films (03.04.2006)
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Journal Article
Atomic scale interface engineering by modulated ion-assisted deposition applied to soft x-ray multilayer optics
Eriksson, Fredrik, Ghafoor, Naureen, Schäfers, Franz, Gullikson, Eric M, Aouadi, Samir, Rohde, Susanne, Hultman, Lars, Birch, Jens
Published in Applied optics. Optical technology and biomedical optics (10.08.2008)
Published in Applied optics. Optical technology and biomedical optics (10.08.2008)
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Electronic properties of Co2MnSi thin films studied by hard x-ray photoelectron spectroscopy
Ouardi, Siham, Gloskovskii, Andrei, Balke, Benjamin, Jenkins, Catherine A, Barth, Joachim, Fecher, Gerhard H, Felser, Claudia, Gorgoi, Mihaela, Mertin, Marcel, Schäfers, Franz, Ikenaga, Eiji, Yang, Ke, Kobayashi, Keisuke, Kubota, Takahide, Oogane, Mikihiko, Ando, Yasuo
Published in Journal of physics. D, Applied physics (21.04.2009)
Published in Journal of physics. D, Applied physics (21.04.2009)
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Journal Article
Influence of sputter damage on the XPS analysis of metastable nanocomposite coatings
Lewin, Erik, Gorgoi, Mihaela, Schäfers, Franz, Svensson, Svante, Jansson, Ulf
Published in Surface & coatings technology (15.11.2009)
Published in Surface & coatings technology (15.11.2009)
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Journal Article
Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4–250 eV
Svechnikov, Mikhail, Chkhalo, Nikolay, Lopatin, Alexey, Pleshkov, Roman, Polkovnikov, Vladimir, Salashchenko, Nikolay, Schäfers, Franz, Sertsu, Mewael G., Sokolov, Andrey, Tsybin, Nikolay
Published in Journal of synchrotron radiation (01.01.2020)
Published in Journal of synchrotron radiation (01.01.2020)
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Journal Article
POLARIMETER: A Soft X-Ray 8-Axis UHV-Diffractometer at BESSY II
Sokolov, Andrey, Schäfers, Franz
Published in Journal of large-scale research facilities (17.11.2016)
Published in Journal of large-scale research facilities (17.11.2016)
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Journal Article
The At-Wavelength Metrology Facility at BESSY-II
Schäfers, Franz, Sokolov, Andrey
Published in Journal of large-scale research facilities (23.02.2016)
Published in Journal of large-scale research facilities (23.02.2016)
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Journal Article
High-reflection Mo/Be/Si multilayers for EUV lithography
Chkhalo, Nikolai I, Gusev, Sergei A, Nechay, Andrey N, Pariev, Dmitry E, Polkovnikov, Vladimir N, Salashchenko, Nikolai N, Schäfers, Franz, Sertsu, Mewael G, Sokolov, Andrey, Svechnikov, Mikhail V, Tatarsky, Dmitry A
Published in Optics letters (15.12.2017)
Published in Optics letters (15.12.2017)
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Journal Article
Optimized highly efficient multilayer-coated blazed gratings for the tender X-ray region
Sokolov, Andrey, Huang, Qiushi, Senf, Friedmar, Feng, Jiangtao, Lemke, Stephanie, Alimov, Svyatoslav, Knedel, Jeniffa, Zeschke, Thomas, Kutz, Oliver, Seliger, Tino, Gwalt, Grzegorz, Schäfers, Franz, Siewert, Frank, Kozhevnikov, Igor V, Qi, Runze, Zhang, Zhong, Li, Wenbin, Wang, Zhanshan
Published in Optics express (10.06.2019)
Published in Optics express (10.06.2019)
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Journal Article
Stable high-reflection Be/Mg multilayer mirrors for solar astronomy at 30.4 nm
Polkovnikov, Vladimir N, Chkhalo, Nikolai I, Pleshkov, Roman S, Salashchenko, Nikolai N, Schäfers, Franz, Sertsu, Mewael G, Sokolov, Andrey, Svechnikov, Mikhail V, Zuev, Sergei Yu
Published in Optics letters (15.01.2019)
Published in Optics letters (15.01.2019)
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Journal Article
Narrowband lamellar multilayer grating with low contrast MoSi2/Si materials for the soft x-ray region
Huang, Qiushi, Feng, Jiangtao, Li, Tongzhou, Wang, Xiangmei, Kozhevnikov, Igor V, Yang, Yang, Qi, Runze, Sokolov, Andrey, Sertsu, Mewael Giday, Schäfers, Franz, Li, Wenbin, Xie, Chun, Zhang, Zhong, Wang, Zhanshan
Published in Journal of physics. D, Applied physics (08.05.2019)
Published in Journal of physics. D, Applied physics (08.05.2019)
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Journal Article
Narrowband lamellar multilayer grating with low contrast MoSi 2 /Si materials for the soft x-ray region
Huang, Qiushi, Feng, Jiangtao, Li, Tongzhou, Wang, Xiangmei, Kozhevnikov, Igor V, Yang, Yang, Qi, Runze, Sokolov, Andrey, Sertsu, Mewael Giday, Schäfers, Franz, Li, Wenbin, Xie, Chun, Zhang, Zhong, Wang, Zhanshan
Published in Journal of physics. D, Applied physics (08.05.2019)
Published in Journal of physics. D, Applied physics (08.05.2019)
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