Photo-Conductivity Measurements of Single Line Structure of Poly (3-hexylthiophen) Patterned Film in Submicro-Meter Range by Conducting Atomic Force Micro scope
HASHIMOTO, Yuichi, SAWADAISHI, Tetsurou, IMO, Kuniharu, SHIMOMURA, Masatsugu
Published in KOBUNSHI RONBUNSHU (01.01.2002)
Published in KOBUNSHI RONBUNSHU (01.01.2002)
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