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SATO, TAKASHI, MORITA, AYUMU,HITACHI, LTD, KAJIWARA, SATORU, KOBAYASHI, MASATO
Year of Publication 02.04.2014
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Year of Publication 02.04.2014
Patent
A study of the reliability of MOSFETs in two stacked thin chips for 3D system in package
Ikeda, A., Sugimoto, Y., Kuwada, T., Kajiwara, S., Fujimura, T., Iwasaki, K., Ogi, H., Hamaguchi, K., Kuriyaki, H., Hattori, R., Kuroki, Y.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
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