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"SATOI TOMOKI"
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X-Ray Analysis of the Structure of Premelted Layers at Ice Interfaces
by
Maruyama, Minoru
,
Satoi
,
Tomoki
,
Taniguchi, Shinji
,
Kawamura, Maiko
,
Kodera, Shiro
,
Kishimoto, Yuko
,
Furukawa, Yoshinori
Published in
Japanese Journal of Applied Physics
(01.12.2000)
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INTEGRATED CIRCUIT, AND DEVICE AND METHOD FOR SUPPORTING THE SAME
by
SATOI TOMOKI
Year of Publication
24.09.2010
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SEMICONDUCTOR INTEGRATED CIRCUIT
by
SATOI TOMOKI
Year of Publication
18.10.2007
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Semiconductor integrated circuit, semiconductor integrated circuit design support device, and semiconductor integrated circuit manufacturing method
by
SATOI TOMOKI
,
NISHIGAKI NAOHIKO
Year of Publication
27.09.2011
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Semiconductor integrated circuit, semiconductor integrated circuit design support device, and semiconductor integrated circuit manufacturing method
by
Satoi
,
Tomoki
,
Nishigaki, Naohiko
Year of Publication
27.09.2011
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Scan test circuit, semiconductor integrated circuit and scan enable signal time control circuit
by
Satoi
,
Tomoki
,
Nishigaki, Naohiko
Year of Publication
16.11.2010
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Scan test circuit, semiconductor integrated circuit and scan enable signal time control circuit
by
SATOI TOMOKI
,
NISHIGAKI NAOHIKO
Year of Publication
16.11.2010
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SEMICONDUCTOR INTEGRATED CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT DESIGN SUPPORT DEVICE, AND METHOD FOR MANUFACTURING THE SEMICONDUCTOR INTEGRATED CIRCUIT
by
SATOI TOMOKI
,
NISHIGAKI NAOHIKO
Year of Publication
25.09.2008
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SCAN TEST CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT, AND SCAN-ENABLE SIGNAL TIMING CONTROLLING CIRCUIT SECTION
by
SATOI TOMOKI
,
NISHIGAKI NAOHIKO
Year of Publication
18.09.2008
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SEMICONDUCTOR INTEGRATED CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT DESIGN SUPPORT DEVICE, AND SEMICONDUCTOR INTEGRATED CIRCUIT MANUFACTURING METHOD
by
SATOI TOMOKI
,
NISHIGAKI NAOHIKO
Year of Publication
11.09.2008
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SCAN TEST CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT AND SCAN ENABLE SIGNAL TIME CONTROL CIRCUIT
by
SATOI TOMOKI
,
NISHIGAKI NAOHIKO
Year of Publication
11.09.2008
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