Cross-layer resilience challenges: Metrics and optimization
Mitra, Subhasish, Brelsford, Kevin, Sanda, Pia N
Published in 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) (01.03.2010)
Published in 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) (01.03.2010)
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Conference Proceeding
Fault-Tolerant Design of the IBM Power6 Microprocessor
Reick, K., Sanda, P.N., Swaney, S., Kellington, J.W., Mack, M.J., Floyd, M.S., Henderson, D.
Published in IEEE MICRO (01.03.2008)
Published in IEEE MICRO (01.03.2008)
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Journal Article
Soft-error resilience of the IBM POWER6 processor
Sanda, P N, Kellington, J W, Kudva, P, Kalla, R, McBeth, R B, Ackaret, J, Lockwood, R, Schumann, J, Jones, C R
Published in IBM journal of research and development (01.05.2008)
Published in IBM journal of research and development (01.05.2008)
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Journal Article
Fault - tolerant design of the IBM POWER6™ microprocessor
Reick, Kevin, Sanda, Pia N., Swaney, Scott, Kellington, Jeffrey W., Floyd, Michael, Henderson, Daniel
Published in 2007 IEEE Hot Chips 19 Symposium (HCS) (01.08.2007)
Published in 2007 IEEE Hot Chips 19 Symposium (HCS) (01.08.2007)
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Conference Proceeding
Phaser: Phased methodology for modeling the system-level effects of soft errors
Rivers, J A, Bose, P, Kudva, P, Wellman, J-D, Sanda, P N, Cannon, E H, Alves, L C
Published in IBM journal of research and development (01.05.2008)
Published in IBM journal of research and development (01.05.2008)
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Journal Article
Soft-error resilience of the IBM POWER6 processor input/output subsystem
Bender, C, Sanda, P N, Kudva, P, Mata, R, Pokala, V, Haraden, R, Schallhorn, M
Published in IBM journal of research and development (01.05.2008)
Published in IBM journal of research and development (01.05.2008)
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Journal Article
Soft error assessments for servers
Muller, K P, Sanda, P N
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
Verification of soft error resilience
KUDVA PRABHAKAR NANDAVAR, CHECK MARK ANTHONY, TREMAINE ROBERT BRETT, SANDA PIA N
Year of Publication 08.10.2013
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Year of Publication 08.10.2013
Patent
Modeling system-level effects of soft errors
Bose, Pradip, Kudva, Prabhakar N, Rivers, Jude A, Sanda, Pia N, Wellman, John-David
Year of Publication 03.01.2012
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Year of Publication 03.01.2012
Patent
Modeling system-level effects of soft errors
WELLMAN JOHN-DAVID, BOSE PRADIP, RIVERS JUDE A, KUDVA PRABHAKAR N, SANDA PIA N
Year of Publication 03.01.2012
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Year of Publication 03.01.2012
Patent
Verification of Soft Error Resilience
KUDVA PRABHAKAR NANDAVAR, CHECK MARK ANTHONY, TREMAINE ROBERT BRETT, SANDA PIA N
Year of Publication 03.03.2011
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Year of Publication 03.03.2011
Patent
Modeling System-Level Effects of Soft Errors
WELLMAN JOHN-DAVID, BOSE PRADIP, RIVERS JUDE A, KUDVA PRABHAKAR N, SANDA PIA N
Year of Publication 01.04.2010
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Year of Publication 01.04.2010
Patent
Method for VLSI system debug and timing analysis
CHASE HAROLD W, KNEBEL DANIEL R, POLONSKY STANISLAV, MENZER DENNIS G, SANDA PIA N
Year of Publication 26.09.2006
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Year of Publication 26.09.2006
Patent
Method for VLSI system debug and timing analysis
Chase, Harold W, Knebel, Daniel R, Menzer, Dennis G, Polonsky, Stanislav, Sanda, Pia N
Year of Publication 26.09.2006
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Year of Publication 26.09.2006
Patent
Method for VLSI system debug and timing analysis
CHASE HAROLD W, KNEBEL DANIEL R, MENZER DENNIS G, POLONSKY STANISLAY, SANDA PIA N
Year of Publication 24.11.2005
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Year of Publication 24.11.2005
Patent
System and method for VLSI visualization
KNEBEL DANIEL R, POLONSKY STANISLAV, MORENO JAMIE, LAVIN MARK A, VOLDMAN STEVEN H, SANDA PIA N
Year of Publication 17.05.2005
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Year of Publication 17.05.2005
Patent
System and method for VLSI visualization
Knebel, Daniel R, Lavin, Mark A, Moreno, Jamie, Polonsky, Stanislav, Sanda, Pia N, Voldman, Steven H
Year of Publication 17.05.2005
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Year of Publication 17.05.2005
Patent